A new device for polarization control at the free electron laser facility FLASH1 at DESY has been commissioned for user operation. The polarizer is based on phase retardation upon reflection off metallic mirrors. Its performance is characterized in three independent measurements and confirms the theoretical predictions of efficient and broadband generation of circularly polarized radiation in the extreme ultraviolet spectral range from 35 eV to 90 eV. The degree of circular polarization reaches up to 90% while maintaining high total transmission values exceeding 30%. The simple design of the device allows straightforward alignment for user operation and rapid switching between left and right circularly polarized radiation.

We analyze and compare 6 different approaches for evaluating energy and position of single X-ray photons detected with conventional pixelated detectors.

In laboratory based x-ray absorption fine structure (XAFS) spectroscopy, the slow readout speed of conventional CCD cameras can prolong the measuring times by multiple orders of magnitude. Using pulsed sources, e.g., laser-based x-ray sources, the pulse repetition rate often exceeds the frame rate of the CCD camera. We report the use of a scientific CMOS (sCMOS) camera for XAFS spectroscopy with a laser-produced plasma source facilitating measurements at 100 Hz. With this technological improvement, a new class of experiments becomes possible, starting from the time consuming analysis of samples with small absorption to pump-probe investigations. Furthermore, laboratory quick soft x-ray absorption fine structure (QXAFS) measurements with 10 ms time resolution are rendered feasible. We present the characterization of the sCMOS camera concerning noise characteristics and a comparison to conventional CCD camera performance. The feasibility of time resolved QXAFS measurements is shown by analyzing the statistical uncertainty of single shot spectra. Finally, XAFS spectroscopy on a complex sandwich structure with minute amounts of NiO exemplifies the additional merits of fast detectors.

With the advent of commercially available CMOS technology suitable for direct detection of photons in the soft X-ray range, new possibilities are opening up for the improvement and optimization of experiments requiring energy discrimination capabilities in this energy range. SDDs are widely used as energy-dispersive detectors, but they cannot be used with pulsed sources due to the overwhelming temporal photon density. Wavelength-dispersive solutions offer unmatched energy resolution, but suffer from low detection efficiency and a limited energy bandwidth which can be monitored. The use of common CCDs as energy-dispersive detectors in this energy range is limited by their energy resolution and especially their readout speed, which can result in significant experimental dead time and limits the usable frequency of pulsed sources. Therewhile, CMOS detectors with high energy resolution and high frame rates are an efficient, versatile and cost-effective alternative as detectors for pulsed sources. In this work we present the characterization of a commercially available, backside-illuminated CMOS detector regarding its energy resolution and quantum efficiency at the BESSY II synchrotron radiation facility with a well-known soft X-ray radiation source. Furthermore it is used in a proof of principle XRF measurement with a laboratory-based laser-plasma source.