We have investigated the photocurrent induced by subbandgap light irradiation at the n-Si-aqueous electrolyte junction., The observed effect is shown to arise from optical processes involving interface states, and mainly from electron transitions from the filled interface states to the conduction band. The dependence of the photocurrent upon anodic voltage is accounted for quantitatively by considering the Schottky barrier lowering effect, already measured from the dark I-V characteristics. The dependence of the photocurrent upon photon energy enables us to extract a density of states curve for the occupied interface states. It suggests that these states are bound states on the semiconductor side, due to the coulomb potential of adsorbed ions. Complementary observations on oxidized and bandgap irradiated junctions are discussed and are found to fit well in the above picture.Experimental evidence for the role of interface states at the semiconductor-electrolyte junction has been brought in many instances, mostly through capacitance and recombination studies (1, 2). These techniques however, hardly permit a systematic investigation of interface states through the semiconductor gap. A true spectroscopy of these states might rather be obtained by observing the photocurrent induced by subbandgap optical transitions between these levels and the semiconductor bands (3, 4). This technique however, suffers from two drawbacks: (i) the expected effects are rather small; (ii) larger effects may be present in the same photon energy range, for example onset of bandgap absorption, transitions involving deep levels in the bulk or the space charge region, and also thermal effects (5). We present here the results of an investigation of the photocurrent induced by subbandgap light at the n-siliconaqueous electrolyte junction, where interface states are known to be present (2, 6). We show that they are indeed responsible for the observed effect and their energy distribution can be attained from the experimental data.