PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment

Abstract

This paper presents PHS-Fill, an ATPG technique that reduces (1) power supply noise for scan-based at-speed testing, and (2) test data volume in a Huffman coding based test compression environment. PHS-Fill first identifies the preferred Huffman symbols; these symbols correspond to the test pattern templates that improve test compression and reduces power supply noise at the same time. ATPG then biases its primary input assignments so that the test pattern blocks match the preferred symbols whenever possible. Simulation results on ISCAS89 and ITC99 benchmark circuits show that PHS-Fill is a promising solution.

Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing

“…(For convenience, we will abbreviate "launch-cycle power supply noise" to "launch noise" hereafter.) Recent papers [8], [24], [4] have addressed the launch noise issue for code-based and lineardecompressor-based compression schemes. However, for the broadcast-based scheme, this issue has not been tackled yet.…”