Solar Cell Materials 2014
DOI: 10.1002/9781118695784.ch3
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Physical Characterisation of Photovoltaic Materials

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Cited by 4 publications
(4 citation statements)
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“…To further elucidate the polycrystallinity of the Si thin film, and because of the thin film size, a grazing incidence XRD scan was performed on the samples; sample 8 shown below (Fig. 3) [22].…”
Section: Resultsmentioning
confidence: 99%
“…To further elucidate the polycrystallinity of the Si thin film, and because of the thin film size, a grazing incidence XRD scan was performed on the samples; sample 8 shown below (Fig. 3) [22].…”
Section: Resultsmentioning
confidence: 99%
“…In contrast to the X-ray diffraction spectrum of the layer produced by vapor-assisted crystallization, the X-ray diffraction features of the AD-processed sample generally show less intensity and, simultaneously, a broader width of the peaks. From both of these observations a smaller average grain size can be concluded [ 41 ].…”
Section: Resultsmentioning
confidence: 99%
“…01-075-0576) are discernible at the 27 and 41% surface coverages indicating no potential chemical reaction between ZnO and SnO 2 :F (within the X-ray detection limits) during the spray pyrolysis process. Since elastic strain and crystallite size effects could not be properly disentangled, only the Scherrer formula 55 is used to compute the average crystallite size (L c ) for different crystallographic orientations. The crystallite size varies from 15 to 55 nm (see Figure 4b).…”
Section: ■ Methodsmentioning
confidence: 99%