2014
DOI: 10.7567/apex.7.095201
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Polarization modulation in GaN-based double-barrier resonant tunneling diodes

Abstract: The effect of polarization modulation on GaN-based double-barrier resonant tunneling diodes is theoretically investigated. The polarization field is shown to improve the performance of these devices by increasing the peak current, peak-to-valley ratio, and negative differential conductance. The high sensitivity of the quantum-well bound energy state with the applied bias explains the observed characteristics. We have further demonstrated that a thin In0.1Ga0.9N layer can significantly improve the performance o… Show more

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Cited by 6 publications
(8 citation statements)
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“…The proposed GaN/AlGaN RTDs are featured of the same order current as the result in [10], [12] and [15] at much lower peak and valley voltages. Moreover, the peak and valley currents and all feature voltages increase nonlinearly with  as illustrated in Figure IV }, which is enough to satisfy the PVCR requirement for low voltage and low power loss MVL and supercomputer design applications.…”
Section: Verifications and Discussionmentioning
confidence: 48%
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“…The proposed GaN/AlGaN RTDs are featured of the same order current as the result in [10], [12] and [15] at much lower peak and valley voltages. Moreover, the peak and valley currents and all feature voltages increase nonlinearly with  as illustrated in Figure IV }, which is enough to satisfy the PVCR requirement for low voltage and low power loss MVL and supercomputer design applications.…”
Section: Verifications and Discussionmentioning
confidence: 48%
“…As a result, the GaN/AlGaN RTD with the crystal plane { 1 0 2 2 } as the initial crystal plane of substrate commence to appear practical NDR characteristic for low voltage and low power loss MVL application, which might be approximately defined as critical RT crystal plane. Even the NDR characteristic of a-plane RTD is observed at less than half peak and valley voltages of the result in [10], [12] and [15]. Besides, the GaN/AlGaN RTD with the crystal plane { 1 0 8 8 } as the initial crystal plane of substrate appears the maximum PVCR at about 34.09.…”
Section: Advances In Computer Science Research Volume 58mentioning
confidence: 90%
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“…signifies the charge increment in the i th layer at given bias voltage than in thermal equilibrium, i  signifies the pure polarization sheet charge density at i th interface and each can be calculated precisely and respectively as 1.4075e13 q/cm -2 , -5.4686e12 q/cm -2 , 1.3102e13 q/cm -2 and -7.4010e12 q/cm -2 by combining the nonlinear polarization model and Vegard's low according to the references [5,7,8].…”
Section: Modeling Of the Proposed Rtdmentioning
confidence: 99%