2004
DOI: 10.1002/polb.20176
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Polymer dynamics in hydrogenous systems by neutron reflectivity

Abstract: Neutron reflectivity is a powerful tool for exploring polymer dynamics above the glass-transition temperature at short diffusion times in layered thin-film systems. Recent studies of membrane-mediated interdiffusion in deuterium-labeled systems have shown that ultrathin membranes can track the position of the interface in binary polymeric diffusion couples and also can discriminate between perdeuterated and hydrogenous polymers of the same molecular weight. This report shows that similar dynamic information ca… Show more

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Cited by 3 publications
(4 citation statements)
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“…The specular X-ray reflectivity measurements were performed at the NIST Center for Neutron Research using Cu Kα radiation with a wavelength of 0.154 nm on a Bruker AXS-D8 Advance diffractometer. The thicknesses of the films were obtained by plotting the refraction-corrected successive minima vs minima index as described by Thompson et al Roughnesses of both the film and the substrate were obtained by fitting the experimental profiles with theoretical curves in Microsoft Excel. , …”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The specular X-ray reflectivity measurements were performed at the NIST Center for Neutron Research using Cu Kα radiation with a wavelength of 0.154 nm on a Bruker AXS-D8 Advance diffractometer. The thicknesses of the films were obtained by plotting the refraction-corrected successive minima vs minima index as described by Thompson et al Roughnesses of both the film and the substrate were obtained by fitting the experimental profiles with theoretical curves in Microsoft Excel. , …”
Section: Methodsmentioning
confidence: 99%
“…The thicknesses of the films were obtained by plotting the refraction-corrected successive minima vs minima index as described by Thompson et al 41 Roughnesses of both the film and the substrate were obtained by fitting the experimental profiles with theoretical curves in Microsoft Excel. 42,43 Results and Discussion…”
Section: Introductionmentioning
confidence: 99%
“…The presence of double layer structure was determined via the observation of single Bragg peak through XR measurements which performed at the NIST Center for Neutron Research using Cu–K α radiation with a wavelength of 1.542 Å on a Bruker AXS‐D8 Advance Diffractometer. The thickness of the films was obtained by analyzing the Kiessig fringe spacing following the method of Thomson et al This method was validated by also fitting the reflectivity curves with a single layer model with both a silicon/polymer and polymer/air roughness in Microsoft Excel …”
Section: Methodsmentioning
confidence: 99%
“…The thickness of the films was obtained by analyzing the Kiessig fringe spacing following the method of Thomson et al 44 This method was validated by also fitting the reflectivity curves with a single layer model with both a silicon/polymer and polymer/air roughness in Microsoft Excel. 45,46…”
Section: X-ray Reflectivitymentioning
confidence: 99%