2009
DOI: 10.1109/tnano.2009.2021844
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Possibility of Transport Through a Single Acceptor in a Gate-All-Around Silicon Nanowire PMOSFET

Abstract: Temperature-dependent electrical transport measurements of cylindrical shaped gate-all-around silicon nanowire p-channel MOSFET were performed. At 4.2 K, they show current oscillations, which can be analyzed by single hole tunneling originated from nanowire quantum dots. In addition to this single hole tunneling, one device exhibited strong current peaks, surviving even at room temperature. The separations between these current peaks corresponded to the energy of 25 and 26 meV. These values were consistent wit… Show more

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Cited by 9 publications
(1 citation statement)
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“…If we suppose the cross-section of initial channel is less than 2 Â 2 nm 2 , there might be 11 dopants within the conduction channel length of 280 nm. However, at very low temperatures, only fewer dopants can be ionized to work as quantum dots, 11 which are distributed randomly in the long conduction channel. To determine the exact positions of the current oscillation features, Figure 2(b) shows the curves of the transconductance g m as a function of gate voltage V g (i.e., g m ¼ @I ds =@V g ) and the gate voltage positions of the g m valleys at varying V ds .…”
mentioning
confidence: 99%
“…If we suppose the cross-section of initial channel is less than 2 Â 2 nm 2 , there might be 11 dopants within the conduction channel length of 280 nm. However, at very low temperatures, only fewer dopants can be ionized to work as quantum dots, 11 which are distributed randomly in the long conduction channel. To determine the exact positions of the current oscillation features, Figure 2(b) shows the curves of the transconductance g m as a function of gate voltage V g (i.e., g m ¼ @I ds =@V g ) and the gate voltage positions of the g m valleys at varying V ds .…”
mentioning
confidence: 99%