Potku – New analysis software for heavy ion elastic recoil detection analysis

Abstract

Time-of-flight elastic recoil detection (ToF-ERD) analysis software has been developed. The software combines a Python-language graphical front-end with a C code computing back-end in a user-friendly way. The software uses a list of coincident time-offlight-energy (ToF-E) events as an input. The ToF calibration can be determined with a simple graphical procedure. The graphical interface allows the user to select different elements and isotopes from a ToF-E histogram and to convert the selections to individual elemental energy and depth profiles. The resulting sample composition can be presented as relative or absolute concentrations by integrating the depth profiles over user-defined ranges. Beam induced composition changes can be studied by displaying the eventbased data in fractions relative to the substrate reference data. Optional angular input data allows for kinematic correction of the depth profiles. This open source software is distributed under the GPL license for Linux, Mac, and Windows environments.

Response of GaN to energetic ion irradiation: conditions for ion track formation

“…All data were collected in the "list mode" and offline replay/analysis with sections was performed using the Potku software package [49]. The total number of ions hitting the sample was calculated using the known solid angle of the detector and the charge × solid angle product determined by simulating the energy spectra of Ga and N using the simulation code SIMNRA [50].…”

Determination of the 9Be(3He,pi)11B (i=0,1,2,3) cross section at 135° in the energy range 1–2.5MeV

“…A simple method, based on the 19 F(p,ac) 16 O resonance excitation of gamma-rays from lead fluoride (PbF 2 ) when bombarded with protons in the energy range from 0.8 MeV to 2.4 MeV, was used for accelerator analysing magnet calibration. Two independent experimental runs were done initially, followed by a third set of experiments done around six months later.…”

“…H, C and O were observed, mostly at the surface, but also within the Be film albeit with low concentration. The areal density of each element was derived with the code POTKU [16]. The uncertainty includes contributions from the counting statistics, background subtraction, geometry via the incidence and scattering angles, beam energy, analysis code and models available, and stopping power.…”

Nucleation and growth of ZnO on PMMA by low-temperature atomic layer deposition

“…Additionally, the thicknesses of the films deposited on Si substrates were measured using optical ellipsometer (Rudolph AutoEL III). The elemental composition and film impurities were investigated using time-offlight elastic recoil detection analysis (ToF-ERDA) 23 26 The surface topography and morphology were studied with atomic force microscopy (AFM) (Digital Instruments, Dimension 3100 Nanoscope, Veeco Metrology Group) and scanning electron microscopy (SEM) (Raith E-line, acceleration voltage 3 kV). The ZnO crystallinity was examined by powder x-ray diffraction (XRD) (PANalytical X'Pert PRO diffractometer, Cu Ka 1 ; k ¼ 1.5406 Å , 45 kV, 40 mA) and analyzed with X'pert HighScore Plus program implemented with the ICDD PDF-4þ powder diffraction database.…”