Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)
DOI: 10.1109/dftvs.1999.802892
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Power consumption in fast dividers using time shared TMR

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Cited by 3 publications
(3 citation statements)
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“…Therefore, these faults must be detected during the operation of the circuit. Generally, transient faults can be detected by self-checking circuits, [5][6][7][8][9] built-in fault detection, and correction circuits [10][11][12][13][14][15][16][17][18][19][20][21] . By using the built-in fault detection and correction circuits, the transient faults can be tolerated during the run time.…”
Section: Introductionmentioning
confidence: 99%
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“…Therefore, these faults must be detected during the operation of the circuit. Generally, transient faults can be detected by self-checking circuits, [5][6][7][8][9] built-in fault detection, and correction circuits [10][11][12][13][14][15][16][17][18][19][20][21] . By using the built-in fault detection and correction circuits, the transient faults can be tolerated during the run time.…”
Section: Introductionmentioning
confidence: 99%
“…[10][11][12][13][14][15][16][17][18][19][20][21] . The recomputing with circularly shifted operands (RECO) technique was applied to multipliers to detect errors during the run time.…”
Section: Introductionmentioning
confidence: 99%
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