2018
DOI: 10.1109/jssc.2018.2793558
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Precision Passive-Charge-Sharing SAR ADC: Analysis, Design, and Measurement Results

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Cited by 28 publications
(4 citation statements)
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“…In recent years, with the rapid development of electronic technology and the massive application of integrated circuits, higher requirements for the reliability and stability of circuits and systems have been put forward, and the circuit system is required to detect key operating parameters quickly and accurately [1][2][3][4]. The high-power devices in integrated circuits cannot withstand short-time overloads and are prone to excessive energy accumulation in the tube due to overvoltage or overcurrent, which can lead to tube damage [5][6][7]. In practice, overcurrent protection circuits are often used to enable power devices' stable and reliable operation [8][9].…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, with the rapid development of electronic technology and the massive application of integrated circuits, higher requirements for the reliability and stability of circuits and systems have been put forward, and the circuit system is required to detect key operating parameters quickly and accurately [1][2][3][4]. The high-power devices in integrated circuits cannot withstand short-time overloads and are prone to excessive energy accumulation in the tube due to overvoltage or overcurrent, which can lead to tube damage [5][6][7]. In practice, overcurrent protection circuits are often used to enable power devices' stable and reliable operation [8][9].…”
Section: Introductionmentioning
confidence: 99%
“…In the literature [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17], several DAC designs have been presented to achieve low-power consumption in a small implementation area. Moreover, these designs are based on direct conversion from the digital domain to the analogue domain.…”
Section: Introductionmentioning
confidence: 99%
“…For DAC design, there are many implementation techniques such as resistor-string DAC [3], capacitor-resistor (C-R) DAC [4], charge redistribution DAC [5], cyclic DAC [6,7], charge scaling with split-capacitor array DAC [8,9], segmented DAC [10], current steering DAC [11], dual-capacitor array DAC [12], charge-sharing DAC [13,14], sigma-delta DAC [15], and pipelined DAC [16,17]. However, resistor-string DACs consume high power and occupy a large area.…”
Section: Introductionmentioning
confidence: 99%
“…In particular, a Sample-wise Switched Reference Charge Reservoir (SS-RCR) technique was introduced [12], where a sufficiently large capacitor (reservoir), β times larger than the total bit capacitors, precharged to the reference voltage level during the sample phase acts as the reference for all bit switchings during the entire ADC. Very recently, a Bitwise Switched Reference Charge Reservoir (BS-RCR) technique was proposed [13], where the charge reservoir capacitor is split into the corresponding bit, and before each bit switching, the corresponding bit charge reservoir capacitor is precharged to the reference levels and used as the reference during each bit decision. With BS-RCRs, a 16-bit 1 MS/s SAR-ADC in 55 nm CMOS with 6.95 mW with a FoM of 738 fJ/conversion-step [14] and a 16-bit 16 MS/s SAR in 55 nm CMOS with FoM 157.4 fJ/conversion-step [15] have been demonstrated.…”
Section: Introductionmentioning
confidence: 99%