1994
DOI: 10.1016/0921-5107(94)90024-8
|View full text |Cite
|
Sign up to set email alerts
|

Preparation and characterization of semi-insulating undoped indium phosphide

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

2
21
0

Year Published

1996
1996
2023
2023

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 38 publications
(23 citation statements)
references
References 9 publications
2
21
0
Order By: Relevance
“…8 • Impurity defects occupying indium atomic sites which act as deep acceptors are formed by annealing and compensate shallow donors, so that the small amount of Fe becomes sufficient to realize semi-insulation. 15 • In InP, hydrogen is incorporated and forms a hydrogen-phosphorus vacancy complex which acts as a shallow donor. Annealing will diffuseout hydrogens and the small amount of Fe becomes sufficient to realize semi-insulation.…”
Section: Resultsmentioning
confidence: 99%
“…8 • Impurity defects occupying indium atomic sites which act as deep acceptors are formed by annealing and compensate shallow donors, so that the small amount of Fe becomes sufficient to realize semi-insulation. 15 • In InP, hydrogen is incorporated and forms a hydrogen-phosphorus vacancy complex which acts as a shallow donor. Annealing will diffuseout hydrogens and the small amount of Fe becomes sufficient to realize semi-insulation.…”
Section: Resultsmentioning
confidence: 99%
“…[1][2][3][4][5] Generally, thermally induced defects in the annealed material can be detected by different spectroscopy methods. [6][7][8] However, most of the reports so far 4-8 ͑including our previous work͒, 9 have been carried out in a single annealing run with high temperature and long duration.…”
Section: ͓S0021-8979͑99͒07616-1͔mentioning
confidence: 99%
“…To achieve lower Fe concentrations, partial pre-compensations by a shallow-acceptor impurity were used, and crystals co-doped with Fe and Zn, InP:(Fe, Zn), were studied [8]. Alternative approaches to the preparation of SI InP were high-temperature annealing of undoped InP in a purephosphorus or iron-phosphide ambient [9,10]. The high-temperature long-term annealing, results in a decrease in the shallow hydrogen-related defects denoted as V In H 4 , which are always present in the InP grown by the LEC technique.…”
Section: Introductionmentioning
confidence: 99%