2016
DOI: 10.1063/1.4967427
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Preparation and optimization of a molybdenum electrode for CIGS solar cells

Abstract: Molybdenum (Mo) films were deposited by radio frequency (RF), direct current (DC) and mixed magnetron sputtering, respectively. With changing the deposition parameters including deposition pressure and power, the films show different surface morphology and crystallinity. Lower resistivity of the films is obtained in the DC mode and better reflectivity of the films is obtained in the RF mode. It is shown that the crystallinity increases when the deposition pressure decreases. The crystallinity and the grain siz… Show more

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Cited by 13 publications
(7 citation statements)
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“…However, fewer people focused on the influences of processing parameters on the properties of Mo bilayer films prepared by RF/DC sputtering method. Commonly, Mo films prepared by RF sputtering have better adhesion to the substrate and higher reflectance but lower conductivity than those prepared by DC sputtering under the same sputtering conditions, but the Mo films prepared by DC sputtering have better conductivity [16]. Actually, the reflectance of Mo back electrode is also very important to the Cu(In,Ga)Se 2 (CIGS), copper zinc tin sulphur (CZTS) and other solar cells, because higher reflectance can improve their photo-conversion efficiency [17].…”
Section: Introductionmentioning
confidence: 99%
“…However, fewer people focused on the influences of processing parameters on the properties of Mo bilayer films prepared by RF/DC sputtering method. Commonly, Mo films prepared by RF sputtering have better adhesion to the substrate and higher reflectance but lower conductivity than those prepared by DC sputtering under the same sputtering conditions, but the Mo films prepared by DC sputtering have better conductivity [16]. Actually, the reflectance of Mo back electrode is also very important to the Cu(In,Ga)Se 2 (CIGS), copper zinc tin sulphur (CZTS) and other solar cells, because higher reflectance can improve their photo-conversion efficiency [17].…”
Section: Introductionmentioning
confidence: 99%
“…This demonstrates that the annealing process leads to crystallization of the previously non-crystallized regions in mainly the (110) orientation. However, no peaks are observed in the (100) and (210) orientations of the perovskite phase, which can be attributed to the specific method of deposition [25][26][27]. The peaks marked with red rectangles and blue circles in figure 1(a) are due to TiO 2 and Ti 2 O 3 , respectively, while the peak marked with a white diamond is due to the Si substrate [28,29].…”
Section: Resultsmentioning
confidence: 97%
“…Using the lower HiPIMS working pressures of 3 mTorr and 5 mTorr, excellent resistivity of 12.6 × 10 −6 Ω•cm and 18.3 × 10 −6 Ω•cm could be respectively obtained. Due to the increased carrier mobility, these results are significantly better than those derived using the DC sputtering conditions [31]. This is because the high coating power density and dissociation rate of HiPIMS make the structural characteristics and surface defects of the Mo films better than those resulting from DC sputtering and facilitate carrier movement.…”
Section: Influence Of Hipims Parameters On Mo Electrical Propertiesmentioning
confidence: 95%