YBa 2 Cu 3 O x films were deposited on various substrates (MgO, SrTiO 3 , IBAD, and textured Ni) by metalorganic chemical vapor deposition (MOCVD) processing. The deposition condition was optimized using MgO and SrTiO 3 single crystal substrates. At low deposition temperatures (T d ) below 700 C, a-axis films were obtained, a-axis and c-axis films at the intermediated T d of 720 C-740 C, and fully c-axis films were obtained at T d above 740 C. The critical current (I c ) of the YBCO films with the film thickness of 0.6 m was 49 A/cm-width (J c = 0 82 MA cm 2 ). When the film thickness increased to 1.6 m, the I c increased to 84.4 A/cm-width, but J c decreased to 0.53 MA cm 2 . The degradation of J c is attributed to the formation of a-axis grains and grains misoriented from the c-axis in the upper part of the films. The YBCO films were successfully deposited on CYC (CeO 2 Y stabilized ZrO 2 (YSZ) CeO 2 on textured Ni), CYY(CeO 2 YSZ Y 2 O 3 on textured Ni), and IBAD(CeO 2 YSZ on stainless steel) templates. The I c s of the YBCO films were 9.5 A/cm-width, 45.8 A/cm-width, and 46.3 A/cm-width, respectively.