2011
DOI: 10.1049/el.2011.1190
|View full text |Cite
|
Sign up to set email alerts
|

Prepassivated AlGaN/GaN HEMTs with improved edge acuity in annealed ohmic contacts

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
2
0

Year Published

2012
2012
2018
2018

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 6 publications
0
2
0
Order By: Relevance
“…The SiN x contact opening was etched using a CF 4 /O 2 -based ICP RIE process 18) and thereafter the GaN/AlGaN surface was etched by 110…”
mentioning
confidence: 99%
See 1 more Smart Citation
“…The SiN x contact opening was etched using a CF 4 /O 2 -based ICP RIE process 18) and thereafter the GaN/AlGaN surface was etched by 110…”
mentioning
confidence: 99%
“…For the source and drain contact formation, a recessed ohmic contact was used to reduce the contact resistance. The SiN x contact opening was etched using a CF 4 /O 2 -based ICP RIE process 18) and thereafter the GaN/AlGaN surface was etched by 110…”
mentioning
confidence: 99%