Present status of high flux beamline (BL40XU) at SPring-8

Inoue, Katsuaki; Oka, Toshihiko; Suzuki, Takuya; Yagi, Naoto; Takeshita, Kunikazu; Goto, Shunji; Ishikawa, Tetsuya

doi:10.1016/s0168-9002(01)00443-0

Cited by 82 publications

(67 citation statements)

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“…Microbeam X-ray diffraction experiments were made at beamline BL40XU at the SPring-8 synchrotron radiation facility (Hyogo, Japan) (Inoue et al, 2001). The peak X-ray energy was 15.0 keV.…”

Section: X-ray Techniquesmentioning

confidence: 99%

An X-ray diffraction study on a single rod outer segment from frog retina

Yagi

Matsuo

Ohta

2012

J Synchrotron Radiat

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X-ray diffraction patterns were recorded from isolated single rod outer segments of frog. The outer segments in Ringer's solution were exposed to a 6 mm microbeam (15 keV) at the BL40XU beamline, SPring-8. The diffraction pattern demonstrated a remarkable regularity in the stacking and flatness of the disk membranes. The electron density profile calculated from the intensity of up to tenth-order reflections showed a pair of bilayers that comprise a disk membrane. The structure of the disk membrane and the changes in the profile on swelling generally agreed with previous reports. Radiation damage was significant with an irradiation of 5 Â 10 5 Gy which is much lower than the known damaging dose on proteins at the liquid-nitrogen temperature.

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“…Microbeam X-ray diffraction experiments were made at beamline BL40XU at the SPring-8 synchrotron radiation facility (Hyogo, Japan) (Inoue et al, 2001). The peak X-ray energy was 15.0 keV.…”

Section: X-ray Techniquesmentioning

confidence: 99%

An X-ray diffraction study on a single rod outer segment from frog retina

Yagi

Matsuo

Ohta

2012

J Synchrotron Radiat

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“…The experiments were carried out at the BL40XU beamline [Inoue et al, 2001] of the SPring-8 third-generation synchrotron radiation facility with an X-ray energy of 15.0 keV (bandwidth about 2%). An X-ray microbeam was obtained by placing a pinhole on the beam [Ohta et al, 2005].…”

Section: Waxrd and Saxs Measurements With An X-ray Microbeammentioning

confidence: 99%

Evaluation of the Distribution and Orientation of Remineralized Enamel Crystallites in Subsurface Lesions by X-Ray Diffraction

Tanaka

Yagi²,

Ohta³

et al. 2010

Caries Res

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Remineralization is the process by which hydroxyapatite (HAp) is restored in enamel subsurface lesions, and transversal microradiography (TMR) has been used to analyze remineralization in terms of the recovery of mineral content. In this study, we directly detected the distribution and orientation of longitudinal HAp crystallite at the remineralized zone in enamel subsurface lesions by using an X-ray microbeam (6-µm diameter) diffraction method. This method was demonstrated and involves the simultaneous detection of wide-angle X-ray diffraction (WAXRD) and small-angle X-ray scattering (SAXS). WAXRD reflects the amount of HAp crystallites, and SAXS reflects that of voids in crystallites. The polished surface of a bovine enamel block was divided into three zones of sound, demineralized, and remineralized zones. Thin sections of approximately 150 µm thickness were then cut perpendicular to the surface, and subjected to WAXRD and SAXS following TMR. The increase in the amount of HAp crystallites and the decrease in voids in the crystallites at the remineralized zone were detected by WAXRD and SAXS, respectively, which was consistent with the result of TMR. This study indicates that both the spatial distribution and orientation of the restored HAp crystals in the remineralization process at the subsurface lesion can be simultaneously analyzed by the X-ray diffraction methods.

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“…X-ray experiments were made at BL40XU in SPring-8 (Inoue et al, 2001). The X-ray energy was either 12.4 or 15.0 keV with a bandwidth of about 3%.…”

Section: Methodsmentioning

confidence: 99%

CMOS flatpanel detectors for SAXS/WAXS experiments

Yagi

Inoue

2006

J Appl Cryst

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A CMOS (complementary metal-oxide semiconductor) flatpanel X-ray detector is a two-dimensional silicon image sensor with a scintillator. We have tested the performance of two types of CMOS detectors in simultaneous small-angle/wideangle X-ray scattering experiments. Both are active-pixel devices that have an amplifier in each pixel. Wide-angle patterns were recorded with the detector just behind the specimen and very close to the beam. The quality of the images shows that these detectors are suitable for this purpose.

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Present status of high flux beamline (BL40XU) at SPring-8

Cited by 82 publications

References 0 publications

An X-ray diffraction study on a single rod outer segment from frog retina

An X-ray diffraction study on a single rod outer segment from frog retina

Evaluation of the Distribution and Orientation of Remineralized Enamel Crystallites in Subsurface Lesions by X-Ray Diffraction

CMOS flatpanel detectors for SAXS/WAXS experiments

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