Ac conductivity [σ m (ω)], dielectric constant [ε (ω)] and dielectric loss [ε (ω)] of solution grown poly (vinylidene fluoride) (PVDF) films (thick ∼85-100 µm) have been measured in the temperature range 77-400 K and in the frequency range 100 HZ-10 MHz. A frequency dependent conductivity described by the relation σ (ω) = Aω s , is observed in the low temperature region where s < 1 and is independent of temperature up to 200 K and decreases with increase in temperature. The density of states at the Fermi level [N (E F )] estimated at 77 K and 100 kHz is ∼1.1×10 18 −4.8×10 19 cm −3 eV −1 . The dielectric constant in the low temperature region (<200 K) shows a very weak frequency and temperature dependence. However, in the higher temperature region (>250 K) a strong frequency dispersion of dielectric constant and strong temperature dependence of ac conductivity are observed. Three relaxations; the α c − , the α a − and the β-relaxations, appearing from high temperature side to the low temperature side in the dielectric loss versus temperature spectrum, having activation energy ∼0.232-0.474 eV, ∼0.189-0.226 eV and ∼ 0.052-0.068 eV, respectively have been observed in the present investigation. The activation energies (∼0.02-0.05 eV) of the charge carriers calculated at 77 K indicates the evidence of electronic hopping conduction in the low temperature region.