1999
DOI: 10.1016/s0167-9317(98)00287-1
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Process and equipment simulation of dry silicon etching in the absence of ion bombardment

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Cited by 9 publications
(2 citation statements)
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“…For precursor screening, a range of etching gases have been evaluated, among them those being widely used for low pressure plasma etching in microelectronics [9,10]. Table 3 summarizes the etching rates achieved under standard conditions (1 l/min (STP) etch gas + 1 l/min (STP) reactive gas).…”
Section: Plasma Chemical Etching Of Silicon Wafersmentioning
confidence: 99%
“…For precursor screening, a range of etching gases have been evaluated, among them those being widely used for low pressure plasma etching in microelectronics [9,10]. Table 3 summarizes the etching rates achieved under standard conditions (1 l/min (STP) etch gas + 1 l/min (STP) reactive gas).…”
Section: Plasma Chemical Etching Of Silicon Wafersmentioning
confidence: 99%
“…[3] η μέθοδος των πεπερασμένων όγκων έχει εφαρμοσθεί στην αριθμητική επίλυση διδιάστατων και τριδιάστατων εξισώσεων μεταφοράς (Kleijn et al, 1989;Kleijn et al, 1991 b;Kleijn and Hoogendoom, 199le;Yang et al, 1992;Werner et al, 1992;Evans and Greif, 1994;Kuijlaars et al, 1995;Kleijn et al, 1996;Winters et al, 1997;Popovska et al, 1997;Lee and Sanchez, 1997;Kim and Lee, 1997;Kuhn et al, 1998;Otto et al, 1999;Kommu et al, 2000;Dollet et al, 2002).…”
Section: κατηγορίες αντιδράσεων στη χημική απόθεση απο ατμόunclassified