2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) 2020
DOI: 10.1109/eptc50525.2020.9315025
|View full text |Cite
|
Sign up to set email alerts
|

Process Optimization Study on Leadframe Surface Enhancements for Delamination Mitigation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
5
0

Year Published

2021
2021
2021
2021

Publication Types

Select...
6
2

Relationship

2
6

Authors

Journals

citations
Cited by 11 publications
(5 citation statements)
references
References 13 publications
0
5
0
Order By: Relevance
“…For succeeding works and studies, this design could be used to process other devices with similar configuration or requirement. Moreover, studies and learnings shared in [6][7][8][9][10] are helpful to improve the die attach process.…”
Section: Discussionmentioning
confidence: 99%
“…For succeeding works and studies, this design could be used to process other devices with similar configuration or requirement. Moreover, studies and learnings shared in [6][7][8][9][10] are helpful to improve the die attach process.…”
Section: Discussionmentioning
confidence: 99%
“…Future works could use the new die design to realize a robust die attach process and prevent any die attach related assembly issues. For references, works shared in [1][2][3][4][5] are helpful in tackling delamination issues. Studies and learnings discussed in [6][7][8][9][10][11][12] are useful to address other die attach related challenges.…”
Section: Discussionmentioning
confidence: 99%
“…Learnings from this manuscript combined with other ideas mentioned in the literature and in [8][9][10][11][12] would help reinforce and promote a lean and robust manufacturing on all branches of industry.…”
Section: Conclusion and Recommenda-tionsmentioning
confidence: 90%