“…We note that the magnitude of the induced gap Δ* = 0.9 meV is lower than the value Δ bulk = 1.75 k B T C = 1.4 meV expected from the transition temperature T C = 9.9 K of the MoRe film (Figure a). This is similar to MoRe/graphene devices showing a reduced Δ* = 1.2 meV. , In analogy with results from Nb-based devices, this could be a consequence of oxidized or contaminated layers at the nonideal InAs/MoRe interface, ,,, defects in the superconductor, and/or carrier-density-dependent interface transparency . Alternatively, the larger Δ bulk leads to a shorter coherence length − L C B = ℏ v F /Δ bulk for ballistic transport and L normalC normalD = ℏ v normalF l normale / 2 Δ bulk for diffusive transportsetting the scale beyond which Δ* decays from the contact. − Taking a typical Fermi velocity v F ≈ 2 × 10 5 m/s and mean free paths l e = 50–200 nm for InAs and Δ bulk = 1.4 meV, we find L C B = 100 nm and L C D = 50–100 nm, smaller than the electrode separation (130 nm for device 1).…”