2007 9th European Conference on Radiation and Its Effects on Components and Systems 2007
DOI: 10.1109/radecs.2007.5205485
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Qualification methodology for sub-micron ICs at the Low Noise Underground Laboratory of Rustrel

Abstract: Alpha contamination has become a major concern in les. To qualify packaging solutions for commercial, industrial, and aerospace/defense com ponents, a program is described. The chosen methodology associates the use of real time testing in altitude and underground environments. Experiments are performed on Xilinx FPGAs. Goals, experiment design, statistical confidence, initial results are analyzed and discussed.

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Cited by 3 publications
(6 citation statements)
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“…e , 10 23 a cm 22 . h 21 ) package (order of magnitude consistent with underground experiments (12) ). Thus, it is clear that the direct ionisation of proton and muon SEU sensitivities is not a critical problematic for ground applications to date.…”
Section: Ground Altitudesupporting
confidence: 70%
“…e , 10 23 a cm 22 . h 21 ) package (order of magnitude consistent with underground experiments (12) ). Thus, it is clear that the direct ionisation of proton and muon SEU sensitivities is not a critical problematic for ground applications to date.…”
Section: Ground Altitudesupporting
confidence: 70%
“…S a consequence of device integration, the charge necessary to induce a bit-flip (SEU: Single-Event Upset) has decreased considerably and effects that were negligible now have to be taken into account for SER (Soft Event Rate) prediction [1][2][3]. From a circuit level point of view, the ion effect can be considered as a noise source for Static Random Access Memories (SRAMs) as power and ground noise, capacitive coupling noise… Among the encountered problems induced by SRAMs shrinking, those created by radioactive impurities and cosmic radiations are significant [1,4].…”
Section: Introductionmentioning
confidence: 99%
“…One of the key in the SEU study is to be able to predict the SER in order to develop hardening solutions or, when it is not possible, to evaluate the associated risk. Several methods can be used to evaluate the SER corresponding to a given technology: real time SSER (System Soft Error Rate) tests in natural environment [2], Accelerated SER tests (ASER) with ions, neutrons beams or alpha source [6], or SER simulations [5]. This work will focus on SER simulation.…”
Section: Introductionmentioning
confidence: 99%
“…Different simulation and experimental approaches are in the literature to estimate the SER induced by terrestrial neutron environment: accelerated testing using alpha, neutron, or proton source/beams, real-time testing performed in the natural environments [11]- [17], and combination of experimental and simulation approaches [18]. An alternative approach consists in using the modeling at device and/or circuit level.…”
mentioning
confidence: 99%
“…Modeling approaches [22]- [26] have demonstrated a good agreement between high-altitude soft-error measurements and simulation results [23]. Then, some high-altitude campaigns dedicated to SER characterizations were achieved [12], [14], [16], [17].…”
mentioning
confidence: 99%