2018
DOI: 10.1039/c8nr02615g
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Quantified hole concentration in AlGaN nanowires for high-performance ultraviolet emitters

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Cited by 24 publications
(15 citation statements)
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“…Thus, it is clear that the one-by-one Hall measurement of single nanorods is probably the most accurate one. However, the method is mostly valid to nanorods or nanowires of brittle and low density, which requires challenging processing procedures [45]. In this case, Hall-effect measurement is enabled by Al-doped ZnO seed layer beneath ZnO nanorods as a conducting medium.…”
Section: Resultsmentioning
confidence: 99%
“…Thus, it is clear that the one-by-one Hall measurement of single nanorods is probably the most accurate one. However, the method is mostly valid to nanorods or nanowires of brittle and low density, which requires challenging processing procedures [45]. In this case, Hall-effect measurement is enabled by Al-doped ZnO seed layer beneath ZnO nanorods as a conducting medium.…”
Section: Resultsmentioning
confidence: 99%
“…However, this constitutes a trade-off as the doping ionization efficiency reduces with increasing Al concentration, resulting in less free holes. In addition, we were able to achieve a hole concentration of 1.3 × 10 19 cm −3 with large injection current [34].…”
Section: Methodsmentioning
confidence: 90%
“…2. Details of EIS measurements can be found in our previous articles [13,20]. The positive slope of the curve for n-InGaN/GaN NWs and the negative slope of the curve for the u-InGaN/p-GaN and p-InGaN/p-GaN NWs were due to successful Si and Mg doping, correspondingly.…”
Section: Methodsmentioning
confidence: 93%
“…The estimated ionized carrier concentrations of the u-InGaN/p-GaN and p-InGaN/p-GaN NWs were in the range of 1 × 10 16 and 7.6 × 10 15 cm -3 , respectively, while that of n-InGaN/n-GaN NWs exhibited the highest concentration of 5.7 × 10 17 cm -3 . As III-nitride NWs are naturally ntype, p-type dopants must usually go through a compensation step before the NWs exhibit ptype characteristics [17,18,20]. The Mg doping may induce more structural defects, which can behave as recombination centers and decrease the ionized dopant concentration [17,20].…”
Section: Methodsmentioning
confidence: 99%
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