2013
DOI: 10.1063/1.4839276
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Quantifying thickness-dependent charge mediated magnetoelectric coupling in magnetic/dielectric thin film heterostructures

Abstract: Precise quantification of the magnetoelectric coupling strength in surface charge induced magnetoelectric effect was investigated in NiFe/SrTiO3thin film heterostructures with different ultra-thin NiFe thicknesses through voltage induced ferromagnetic resonance. The voltage induced ferromagnetic resonance field shifts in these NiFe/SrTiO3thin films heterostructures showed a maximum value of 65 Oe at an intermediate NiFe layer thickness of ∼1.2 nm, which was interpreted based on the thin film growth model at th… Show more

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Cited by 35 publications
(32 citation statements)
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“…21 Furthermore, precise quantification of the ME coupling strength in the surface charge induced ME effect in NiFe/SrTiO 3 thin film heterostructures with different ultra-thin NiFe thicknesses was investigated using voltage induced ferromagnetic resonance (FMR). The voltage induced FMR field shifts in these NiFe/SrTiO 3 thin film heterostructures showed a maximum value of 65 Oe at an intermediate NiFe layer thickness of ∼1.2 nm, as reported by Sun et al 22 . However, to date, most studies have only investigated changes in the magnetic anisotropy induced strain, and few articles to study the temperature dependence of magnetic coupling effect.…”
Section: © 2016 Author(s) All Article Content Except Where Otherwissupporting
confidence: 55%
“…21 Furthermore, precise quantification of the ME coupling strength in the surface charge induced ME effect in NiFe/SrTiO 3 thin film heterostructures with different ultra-thin NiFe thicknesses was investigated using voltage induced ferromagnetic resonance (FMR). The voltage induced FMR field shifts in these NiFe/SrTiO 3 thin film heterostructures showed a maximum value of 65 Oe at an intermediate NiFe layer thickness of ∼1.2 nm, as reported by Sun et al 22 . However, to date, most studies have only investigated changes in the magnetic anisotropy induced strain, and few articles to study the temperature dependence of magnetic coupling effect.…”
Section: © 2016 Author(s) All Article Content Except Where Otherwissupporting
confidence: 55%
“…and $ 200 Oe (NiFe/PMN-PT) 59 FMR field tunability was demonstrated. FMR tunability was also shown in MgO ultrathin film magnetic tunneling junctions (MTJ).…”
mentioning
confidence: 96%
“…The strain and charge co-mediated ME coupling in ultra-thin magnetic/ ferroelectric heterostructures could lead to power efficient and nonvolatile ME devices with enhanced ME coupling. After distinguishing the charge mediated ME coupling strength, Zhou et al 59 then investigated the correlation between charge mediated ME coupling strength and thickness of NiFe ultrathin magnetic film in order to maximize the performance of charge-mediated ME devices. Precise quantification of the ME coupling strength in surface chargeinduced ME effect was studied in NiFe/SrTiO 3 thin film heterostructures with different ultra-thin NiFe thicknesses through voltage-induced FMR measurements, as shown in Fig.…”
Section: Fmr Tuning By Interfacial Charge-induced Me Couplingmentioning
confidence: 99%
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