Quantitative determination of tip parameters in piezoresponse force microscopy

Abstract

One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180° domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.

Ultrathin limit and dead-layer effects in local polarization switching of BiFeO3

“…interfaces, which, in turn, suppress spontaneous polarization through the effect of the wall profile was fitted using the following equation [34]:…”

Method to calculate electric fields at very small tip-sample distances in atomic force microscopy

“…The GICM f includes a modification of the standard leastsquares minimization technique that can be easily extrapolated to different numerical methods such as the one proposed by Kalinin et al 17 and Morozovska et al 18 In these articles, several charged elements such as disks, lines or punctual charges are used to obtain the electrostatic potential around the tip. As well as the standard GICM, this configuration can be combined with the GICM f minimization to improve the quality of the results around the tip apex when D is very small.…”

Domain dynamics in piezoresponse force spectroscopy: Quantitative deconvolution and hysteresis loop fine structure

“…2 can be estimated from The fitting for strongly anisotropic domains, r s /l<<1, is shown to lead to unphysically large tip sizes, d≈300nm, or lateral domain shifts, a≈100nm, inconsistent with d≤35-40nm as determined from observed ferroelectric domain wall width. 21 To account for this discrepancy,…”