Quantitative XPS. Part I: Experimental determination of the relative analyser transmission function of two different spectrometers — a critical assessment of various methods, parameters involved and errors introduced

Weng, Lt.; Vereecke, Guy; Genet, Mj.; Bertrand, Patrick; Stone, William E.

doi:10.1002/sia.740200302

Cited by 63 publications

(21 citation statements)

References 39 publications

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“…The latter takes into account the cross-section taken from Scoffield and the kinetic energy dependence (E k 0.7 ). 38,39 Only average values recorded from two samples are presented.…”

Section: Xps (Esca)mentioning

confidence: 99%

Fibronectin-pluronic coadsorption on a polystyrene surface with increasing hydrophobicity: Relationship to cell adhesion

Detrait

Lhoest

Bertrand

et al. 1999

J. Biomed. Mater. Res.

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Recently, patterned polystyrene surfaces containing hydrophobic (PS) and more hydrophilic (PSox) areas have been shown to be capable of directing cellular growth, which is mainly due to the competitive adsorption of adhesive and antiadhesive molecules. In this article, the competitive adsorption between a pluronic surfactant and fibronectin was studied on homogeneous PS or PSox substrates conditioned with mixtures containing increasing concentrations of one of the two molecules. Radiolabeling and X-ray photoelectron spectroscopy techniques showed that fibronectin adsorption increased on both surfaces if the fibronectin concentrations increased in the conditioning mixture. In contrast, fibronectin adsorption decreased on PSox and did not occur on PS surfaces when pluronic concentrations increased in the coating mixture. A comparison of these data with pheochromocytoma and Schwann cells cultured on patterned surfaces showed that the direction of cell growth on PSox areas depended first on the relative concentrations of the two components in the mixtures, and second, on their ratio; the best concentration ratio probably depends on the cell's ability to recondition its support.

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“…The latter takes into account the cross-section taken from Scoffield and the kinetic energy dependence (E k 0.7 ). 38,39 Only average values recorded from two samples are presented.…”

Section: Xps (Esca)mentioning

confidence: 99%

Fibronectin-pluronic coadsorption on a polystyrene surface with increasing hydrophobicity: Relationship to cell adhesion

Detrait

Lhoest

Bertrand

et al. 1999

J. Biomed. Mater. Res.

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“…The relative loss of F during these long exposures ͑up to 4 h͒ to the x-ray beam was checked on samples with high F concentration to be less than 10%. The influence of analyzer energy on peak intensities was corrected by accounting for the spectrometer transmission function that was determined with method V given in Weng et al 31,32 Surface concentrations were derived from corrected intensities by the use of sensitivity factors provided by the spectrometer manufacturer. The concentration of F in the oxide layer was calculated as ͓F͔ oxide (%)ϭ100 I F ls…”

Section: Methodsmentioning

confidence: 99%

Investigation of fluorine in dry ultrathin silicon oxides

Vereecke

Röhr

Carter

et al. 2001

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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The origins of fluorine in dry ultrathin silicon oxides (<1 nm) were investigated as the incorporation of fluorine in these layers may improve their reliability and interface quality. Oxides were grown at room temperature (RT) by UV/O2 in an integrated tool combining vapor HF surface preparation and oxide growth in a single chamber. The chemical composition and thickness of the layers were characterized by x-ray photoelectron spectroscopy. It is shown that incorporation of fluorine in these oxides originated mainly from the contamination of the tool (dead spaces and surface adsorption) and from the fluorine left at the wafer surface by the in situ HF process. The levels of these sources of fluorine were about two orders of magnitude higher than from a wet HF dip. No evidence was found for the existence of subsurface fluorine [Kasi et al., Appl. Phys. Lett. 58, 2975 (1991)] as oxides grown in a separate noncontaminated cell (UV/O2, 1 atm O2, RT to 200 °C) did not show any significant increase in fluorine content as a function of oxide thickness. Hence the amount of fluorine incorporated into oxides grown in cluster tools under similar conditions will depend not only on the method selected for surface preparation but also on whether surface preparation and oxidation are performed in the same chamber or not. The possible benefits of determined fluorine levels are discussed.

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“…For the reconstruction of the diffraction pattern it must be considered that for every energy analyzer the recorded photoelectron intensity is proportional to a device specific transmission function that will also depend on the particular mode of operation [16]. Due to the two dispersive axes (angle and energy) the transmission function of the WAL detector depends on energy and detector angle, and therefore I(E, α) ∝ T (E, α).…”

Section: Reconstruction Of Complete Diffraction Patterns From Single mentioning

confidence: 99%

Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer

Greif

Castiglioni

Becker‐Koch

et al. 2014

Journal of Electron Spectroscopy and Related Phenomena

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An efficient and fast way to measure photoelectron diffraction data over the full 2 angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(1 1 1) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality. The sampling technique is extended to UV-excited angle-resolved photoelectron spectroscopy as illustrated by a mapping of the Fermi surface of Cu (1 1 1 AbstractAn efficient and fast way to measure photoelectron diffraction data over the full 2π angular range with high data point density is presented, taking advantage of the massive parallel detection capabilities of modern two-dimensional electron detectors. We introduce generic routines for data binning and for the mapping of the detector signal onto emission angles. X-ray photoelectron diffraction patterns taken from Bi(111) with the new detection scheme are compared to data sets taken with a conventional hemispherical analyzer equipped with a channeltron detector. As a result, the data acquisition time can be reduced by roughly a factor of ten while obtaining comparable if not superior data quality.The sampling technique is extended to uv-excited angle-resolved photoelectron spectroscopy as illustrated by a mapping of the Fermi surface of Cu(111).

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Quantitative XPS. Part I: Experimental determination of the relative analyser transmission function of two different spectrometers — a critical assessment of various methods, parameters involved and errors introduced

Cited by 63 publications

References 39 publications

Fibronectin-pluronic coadsorption on a polystyrene surface with increasing hydrophobicity: Relationship to cell adhesion

Fibronectin-pluronic coadsorption on a polystyrene surface with increasing hydrophobicity: Relationship to cell adhesion

Investigation of fluorine in dry ultrathin silicon oxides

Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzer

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