Radiation characterization of COTS components for a signal packet router in the upgrade of the ATLAS muon spectrometer

Hu, X.; Wang, J.; Qian, Z.; Hou, S.; Vari, R.; Schwarz, Thomas; Zhou, B.

doi:10.1088/1748-0221/14/10/p10023

Cited by 3 publications

(2 citation statements)

References 9 publications

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“…Radiation tolerance. The Router's tolerance to total ionization dose was shown acceptable and reported in [42,101]. SEU's in the FPGA fabric or its configuration memory can cause malfunction or halting of the Router operation.…”

Section: Jinst 18 P05012mentioning

confidence: 99%

The New Small Wheel electronics

et al. 2023

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The increase in luminosity, and consequent higher backgrounds, of the LHC upgrades require improved rejection of fake tracks in the forward region of the ATLAS Muon Spectrometer. The New Small Wheel upgrade of the Muon Spectrometer aims to reduce the large background of fake triggers from track segments that don't originate from the interaction point. The New Small Wheel employs two detector technologies, the resistive strip Micromegas detectors and the “small” Thin Gap Chambers, with a total of 2.45 million electrodes to be sensed. The two technologies require the design of a complex electronics system given that it consists of two different detector technologies and is required to provide both precision readout and a fast trigger. It will operate in a high background radiation region up to about 20 kHz/cm2 at the expected HL-LHC luminosity of ℒ = 7.5 × 1034 cm-2 s-1. The architecture of the system is strongly defined by the GBTx data aggregation ASIC, the newly-introduced FELIX data router and the software based data handler of the ATLAS detector. The electronics complex of this new detector was designed and developed in the last ten years and consists of multiple radiation tolerant Application Specific Integrated Circuits, multiple front-end boards, dense boards with FPGA's and purpose-built Trigger Processor boards within the ATCA standard. The New Small Wheel has been installed in 2021 and is undergoing integration within ATLAS for LHC Run 3. It should operate through the end of Run 4 (December 2032). In this manuscript, the overall design of the New Small Wheel electronics is presented.

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Section: Jinst 18 P05012mentioning

confidence: 99%

The New Small Wheel electronics

et al. 2023

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“…Accelerated radiation resource is a rare and expensive resource. In addition, accelerated radiation experiments may destroy the chip under test [3]. Mathematical analysis models can help developers estimate the reliability of their designs before running them [4].…”

Section: Introductionmentioning

confidence: 99%

An SEU fault injection platform for radiation-harden design debugging in the FPGA

Zhang¹,

Zhou²,

Wang³

et al. 2022

J. Inst.

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An SEU fault injection platform was designed to ease the debugging of radiation-harden design in FPGA. The platform includes the FPGA being tested, the functional firmware being debugged, the essential-bit extraction algorithm based on Python, and the random fault injection algorithm. The platform can inject single-bit SEU failures, adjacent two-bit SEU failures, and three-bit SEU failures. It works in two modes: normal injection mode and essential-bit injection mode. Functional failure rate is the performance metric which used to evaluate the development. It is the probability of triggering a DUT function failure. In this experiment, the SEU fault injection platform is verified by measuring whether TCP/IP communication links are disconnected due to SEU faults. Experimental results show that the probability of TCP/IP link disconnection in normal injection mode is 0.13%, 0.23% and 0.25% respectively when random injection of single-bit SEU failure, adjacent two-bit SEU failure and multi-bit SEU failure occurs 10,000 times. In the essential-bit injection mode, the probability of TCP/IP link disconnection caused by single-bit SEUs failure, adjacent two-bit SEUs failure and three-bit SEUs failure is 0.87%, 6.97% and 11.76% respectively, indicating a significant increase in the functional failure rates. This shows that the essential-bit injection mode can be used to expose problems more quickly and accelerate the debugging process of FPGA radiation-harden design.

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