2017
DOI: 10.1088/1361-6641/aa57f6
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Radiation effects in reconfigurable FPGAs

Abstract: Field-programmable gate arrays (FPGAs) are co-processing hardware used in image and signal processing. FPGA are programmed with custom implementations of an algorithm. These algorithms are highly parallel hardware designs that are faster than software implementations. This flexibility and speed has made FPGAs attractive for many space programs that need in situ, high-speed signal processing for data categorization and data compression. Most commercial FPGAs are affected by the space radiation environment, thou… Show more

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Cited by 43 publications
(12 citation statements)
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“…Finally, a fraction of them can be trapped in deep hole traps, inducing long term effects in the bulk with consequent alteration of the electrical characteristics of the electronic devices. 11,[16][17][18][19][20][21] Regarding the optical components for Space applications, a potential damage induced by radiation can be detrimental to the performances of the whole optical system. The typical radiationinduced effect consists of the transmittance loss due to the formation of charged defects (colour centres) and of network disorder increase.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, a fraction of them can be trapped in deep hole traps, inducing long term effects in the bulk with consequent alteration of the electrical characteristics of the electronic devices. 11,[16][17][18][19][20][21] Regarding the optical components for Space applications, a potential damage induced by radiation can be detrimental to the performances of the whole optical system. The typical radiationinduced effect consists of the transmittance loss due to the formation of charged defects (colour centres) and of network disorder increase.…”
Section: Introductionmentioning
confidence: 99%
“…The space radiation issues, like total ionising dose (TID) and single event upsets (SEU), are important concerns when choosing components for design that will be used in space [19]. For the static random access memory-based FPGAs, like the one used for our design, there are many established methods for mitigating these issues [20], [21].…”
Section: Related Workmentioning
confidence: 99%
“…TID causes a degradation of the transistors as ionizing radiation accumulates on the component. This degradation leads to creating trapped charges that will slowly affect the electrical parameters of the device (threshold voltage (V th ) and leakage current) [9]. In this context, NMOS and PMOS transistors behave differently.…”
Section: Tid On Sram Fpgasmentioning
confidence: 99%