2015
DOI: 10.1366/13-07431
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Raman Spectroscopic Study on Phosphorous-Doped Silicon Nanoparticles

Abstract: The Raman spectra of films prepared from 8, 19, and 30 nm nanoparticles of silicon doped with phosphorous were measured with excitation at 514.5 nm. The observed spectra were analyzed by decomposing the observed Raman bands into three symmetric Voigt function bands, which were assigned to the Si-Si stretching modes of crystalline, boundary, and amorphous-like components. The fractions of crystalline, boundary, and amorphous-like regions were estimated from the obtained components. The obtained fractions can be… Show more

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Cited by 6 publications
(6 citation statements)
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“…By performing this analysis, SiNPs can be distinguished from the cell interior. It is known, that the cell interior is emitting the Raman bands of the protein-backbone vibrations, while SiNPs show the characteristic Raman peak at 520 cm −1 [ 17 , 72 , 73 , 74 ]. Thus, by picking up the spectrum of interest from the set of clusters, two clusters, corresponding to the SiNPs (depicted in red) and to the protein composition of the cells (depicted in blue), have been detected (see Figure 3 a).…”
Section: Resultsmentioning
confidence: 99%
“…By performing this analysis, SiNPs can be distinguished from the cell interior. It is known, that the cell interior is emitting the Raman bands of the protein-backbone vibrations, while SiNPs show the characteristic Raman peak at 520 cm −1 [ 17 , 72 , 73 , 74 ]. Thus, by picking up the spectrum of interest from the set of clusters, two clusters, corresponding to the SiNPs (depicted in red) and to the protein composition of the cells (depicted in blue), have been detected (see Figure 3 a).…”
Section: Resultsmentioning
confidence: 99%
“…The recovered band position and FWHM are in agreement with previous literature reports for aSi. 40 The second band was associated with SiNCs; the band peak frequency, FWHM, and amplitude were all position dependent. This is indicative of SiNCs that differ in size and size distribution within the specimen.…”
Section: Resultsmentioning
confidence: 98%
“…Table 1 collects previously reported band positions for cSi and aSi 24,25,31,33,4043 along with our recovered values for an authentic cSi sample and aSi (vide infra). Figures 4a to 4f present the Raman spectra recorded at each numbered position shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…30 Beyond FT-IR spectroscopy of ice, doped silicon is also know to exhibit an amorphous layer, which is 1 nm thick, and its Raman signature is distinct of that of the bulk. 31 Practically, measuring the FT-IR/Raman spectra of the surface of crystals is quite difficult, for two reasons primarily. First, except for the very smallest of crystal sizes, there is a small amount of surface in relation to the bulk.…”
Section: Discussionmentioning
confidence: 99%
“…[27][28][29][30] Silicon nanoparticles are also known to have a layer of surface disorder which can be differentiated from the bulk using Raman spectroscopy and transmission electron microscopy. 31…”
Section: Introductionmentioning
confidence: 99%