2010
DOI: 10.1021/jz900375a
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Rate-Limiting Processes Determining the Switching Time in a Ag2S Atomic Switch

Abstract: The switching time of a Ag 2 S atomic switch, in which formation and annihilation of a Ag atomic bridge is controlled by a solid-electrochemical reaction in a nanogap between two electrodes, is investigated as a function of bias voltage and temperature. Increasing the bias voltage decreases the switching time exponentially, with a greater exponent for the lower range of bias than that for the higher range. Furthermore, the switching time shortens exponentially with raising temperature, following the Arrhenius … Show more

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Cited by 109 publications
(84 citation statements)
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“…27 Also for other ECM systems these processes have been identied as rate-limiting. [28][29][30][31][32][33][34] In the case of a unipolar switching TiO 2 -based TCM cell, the formation of a lamentary-shaped Magnéli phase was observed by the means of TEM. 35,36 This phase transition, however, is induced by the movement of the ionic defects within the switching layer.…”
Section: Analytical Analysismentioning
confidence: 99%
“…27 Also for other ECM systems these processes have been identied as rate-limiting. [28][29][30][31][32][33][34] In the case of a unipolar switching TiO 2 -based TCM cell, the formation of a lamentary-shaped Magnéli phase was observed by the means of TEM. 35,36 This phase transition, however, is induced by the movement of the ionic defects within the switching layer.…”
Section: Analytical Analysismentioning
confidence: 99%
“…The threshold voltages are strongly dependent on the chalcogenide material, electrode material, and geometry of the metal-chalcogenidemetal cell. 4,[7][8][9][10] In the case of ionic transport, conductance switching is due to the formation and dissolution of metallic filaments between the electrodes. The formation and dissolution of such nanoscale metallic filaments is driven by the polarity and amplitude of the voltage applied.…”
Section: Introductionmentioning
confidence: 99%
“…[24] The large lateral extension of the conductive protrusion with respect to the contact area between the tip and the sample surface (which can be estimated around few tens of nanometer-square [21]) can be related to the water meniscus formed around the AFM tip placed under atmospheric conditions. [25].…”
mentioning
confidence: 99%