Rational methodological approach to evaluation of dose resistance of CMOS microcircuits with respect to low intensity effects

Abstract

A rational methodological approach to the evaluation of the total dose hardness of CMOS micro circuits with respect to low dose rate effects supported by the results of the simulation analysis and experi mental studies of a wide range of products is presented. This approach makes it possible to choose the neces sary and sufficient amount of radiation researches that provide accurate and informative engineering evalua tion of radiation hardness of CMOS microcircuits for use in space hardware.

Composition and principle of formation of standard evaluation circuit as simulator of gate arrays and semicustom very large scale IC based on them for radiation tests

“…At the same time it is necessary to consider that if the range of parameters of digital components of GA is rather limited (functional control, the levels of logic zero and one, current consumption, input current), then for analog components it is very wide (table). [11][12][13][14].…”

“…При этом следует учитывать, что если состав ПКГ цифровых узлов БМК довольно ограничен (функциональный контроль, уровни логических нуля и единицы, ток потребления, входной ток), то для аналоговых узлов БМК состав ПКГ весьма разнообразен (см. таблицу) [11][12][13][14].…”

DC–DC's total ionizing dose hardness decrease in passive reserve mode

“…All radiation experiments were supported by soft-hardware automated test setup (ATS) that had been developed for DC-DC's functional and parametrical control [17][18][19][20][21].…”

Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers

“…The designed setup can be easily adopted for different types of radiation hardness tests of MCUs: single event effects and dose rate effects evaluations [14][15][16][17][18] as well as for a lot of other purposes tests. The developed solutions can be used for other types of test devices: FPGAs, memories, ADCs, DC-DC converters and others [19][20][21].…”