2002
DOI: 10.1007/s11664-002-0046-2
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Recrystallization and intermetallic formation in Au/Al and Au/Zn bimetallic films

Abstract: Bimetallic thin films are of interest for use in microelectromechanical systems (MEMS) for the fabrication of sensors and actuators. The coefficient of thermal expansion (CTE) mismatch between the two metal films of the bimetallic structure can be used to attain the desired level of deflection or actuation in the MEMS device. Gold/aluminum and gold/zinc films have desirable properties for use in bimetallic films because of their differences in CTE. The stress-temperature behavior of these bimetal configuration… Show more

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Cited by 2 publications
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“…The mechanical properties of bimetallic films have been shown to change with time and temperature aging due to intermetallic diffusion and recrystallization. 6,7 Intermetallic diffusion between the two films hinders the long-term reliability and reproducible behavior of these devices. Other material properties that must be considered in the choice of metals in bimetallic beams are ductility, resistance to fatigue or work hardening, electrical conductivity, the temperature of alloy or compound formation, and the ease of processing.…”
mentioning
confidence: 99%
“…The mechanical properties of bimetallic films have been shown to change with time and temperature aging due to intermetallic diffusion and recrystallization. 6,7 Intermetallic diffusion between the two films hinders the long-term reliability and reproducible behavior of these devices. Other material properties that must be considered in the choice of metals in bimetallic beams are ductility, resistance to fatigue or work hardening, electrical conductivity, the temperature of alloy or compound formation, and the ease of processing.…”
mentioning
confidence: 99%