2003
DOI: 10.1007/s00339-002-1960-0
|View full text |Cite
|
Sign up to set email alerts
|

Recrystallization behavior of high-dose Mn + -implanted GaAs

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
1
0

Year Published

2006
2006
2006
2006

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…As for the dependence of Mn implantation dose on I TO /I E H 2 , it is expected that more residual damage exists in the implanted material with increasing implantation dose. This phenomenon has also been reported by many authors in investigating Mn implanted GaAs [22], where the intensity ratio of I TO /I LO was used as a measure of the damage degree. Fig.…”
mentioning
confidence: 71%
“…As for the dependence of Mn implantation dose on I TO /I E H 2 , it is expected that more residual damage exists in the implanted material with increasing implantation dose. This phenomenon has also been reported by many authors in investigating Mn implanted GaAs [22], where the intensity ratio of I TO /I LO was used as a measure of the damage degree. Fig.…”
mentioning
confidence: 71%