Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports

Williams, Dylan F.

doi:10.1109/arftg76.2010.5700048

Cited by 9 publications

(4 citation statements)

References 10 publications

(9 reference statements)

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“…The problem has been recognized, and attempts have been made to move the measurement reference plane away from the interconnect to locations where the higher modes have decayed [12][13][14]. This is illustrated in figures 4 and 5 by the reference planes 1 and 2.…”

Section: The Role Of the Measurement Reference Planementioning

confidence: 99%

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Establishing traceability for the measurement of scattering parameters in coaxial line systems

et al. 2018

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Scattering parameters are fundamental quantities in radio frequency and microwave metrology. Traceability to SI units for these measurements is established with the help of calculable standards. Progress has been made over recent years in characterizing these standards. Major steps forward have been achieved with advanced modelling of the entire standard, including connector interface and with the use of multivariate uncertainty evaluation, taking correlations fully into account. The improvements have led to more consistent, more accurate measurements.

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Section: The Role Of the Measurement Reference Planementioning

confidence: 99%

“…The number of free parameters must not be larger than the number of functions, i.e. the number of elements in F as defined by (13). Otherwise, the problem becomes under-determined.…”

Section: Calibration Algorithmmentioning

confidence: 99%

Establishing traceability for the measurement of scattering parameters in coaxial line systems

et al. 2018

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“…This process is more complicated than the general TRL or LRL calibration. Previous work [4] determined an equivalent standard definition for a vector network analyzer (VNA) calibration model, including the S-parameter of misaligned waveguides. This method removes the effect of the discontinuity occurring in the connections of the waveguide.…”

Section: Introductionmentioning

confidence: 99%

Pin-Gap Correction of Coaxial Calibration Standards for TRL or LRL Calibration

et al. 2022

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In this paper, a novel method is proposed by which to correct the pin gaps of coaxial calibration standards for Thru-Reflect-Line (TRL) or Line-Reflect-Line (LRL) calibration. This method is a post-process in which the pin-gap correction is applied to the measured S-parameters of the device under test (DUT) after TRL or LRL calibration. It is based on the perturbation equations derived from the sensitivity-coefficient approach. These equations enable us to obtain the correction quantity of the DUT-S-parameter due to the pin gaps. We verify the proposed method by simulation for a 2.4 mm coaxial line, and the result shows that the pin-gap correction works successfully. Because the method is based on the perturbation equations, the smaller the pin gap, the better the correction results. Nevertheless, we can achieve sufficient correction results within the range of the pin-gap to at least 10 times the nominal value. In addition, the proposed pin-gap correction can play the role of impedance renormalization, even though the two LRL calibration lines have different characteristic impedance. Finally, we demonstrate the correction method for a 2.4 mm coaxial LRL calibration kit through measurement.

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“…Precision gold-plated shims provide a quarter-wavelength transmission phase shift at the band mid frequency. The input reflection coefficient of the shim as thru device is dominated by a) the waveguide cross-sectional mechanical dimensions and b) by the effective load match of the output port (Williams, 2010), (Judaschke, 2011). If the thru device is highly reflective instead of being a perfect waveguide also the effective source match generates an input standing wave.…”

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confidence: 99%

Verification of scattering parameter measurements in waveguides up to 325 GHz including highly-reflective devices

et al. 2011

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Abstract. Radio-frequency (RF) scattering parameters (S-parameters) play an important role to characterise RF signal transmission and reflection of active and passive devices such as transmission lines, components, and small-signal amplifiers. Vector network analysers (VNAs) are employed as instrumentation for such measurements. During the last years, the upper frequency limit of this instrumentation has been extended up to several hundreds of GHz for waveguide measurements. Calibration and verification procedures are obligatory prior to the VNA measurement to achieve accurate results and/or to obtain traceability to the International System of Units (SI). Usually, verification is performed by measuring well-matched devices with known S-parameters such as attenuators or short precision waveguide sections (shims). In waveguides, especially above 110 GHz, such devices may not exist and/or are not traceably calibrated. In some cases, e.g. filter networks, the devices under test (DUT) are partly highly reflective. This paper describes the dependency of the S-parameters a) on the calibration procedure, b) on the applied torque to the flange screws during the mating process of the single waveguide elements. It describes further c) how highly-reflective devices (HRD) can be used to verify a calibrated VNA, and d) how a measured attenuation at several hundreds of GHz can be substituted by a well-known coaxial attenuation at 279 MHz, the intermediate frequency (IF) of the VNA, to verify the linearity. This work is a contribution towards traceability and to obtain knowledge about the measurement uncertainty of VNA instrumentation in the millimetre-wave range.

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Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports

Cited by 9 publications

References 10 publications

Establishing traceability for the measurement of scattering parameters in coaxial line systems

Establishing traceability for the measurement of scattering parameters in coaxial line systems

Pin-Gap Correction of Coaxial Calibration Standards for TRL or LRL Calibration

Verification of scattering parameter measurements in waveguides up to 325 GHz including highly-reflective devices

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