2019
DOI: 10.1016/j.micpro.2019.102871
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Reliability characterization and activity analysis of lowRISC internal modules against single event upsets using fault injection and RTL simulation

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Cited by 5 publications
(4 citation statements)
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“…Regarding RISC-V, since the RISC-V itself is an open-source hardware, many RoT modifications have been proposed directly into the hardware system. Many RISC-V RoT examples are the Rambus CryptoManager [28] and the OpenTitan [29]. The RoT is the designated location for keeping and overseeing the root key and certificates of the device.…”
Section: Introductionmentioning
confidence: 99%
“…Regarding RISC-V, since the RISC-V itself is an open-source hardware, many RoT modifications have been proposed directly into the hardware system. Many RISC-V RoT examples are the Rambus CryptoManager [28] and the OpenTitan [29]. The RoT is the designated location for keeping and overseeing the root key and certificates of the device.…”
Section: Introductionmentioning
confidence: 99%
“…In consequence, logical fault injection has therefore gained attention, as it yields early reliability assessment, even during the design phases, at lower costs. It includes 2 main strategies: emulation-based fault injection, in which the real system is either emulated, usually with an FPGA, or the faults are emulated on real devices [8]; and simulation-based fault injection, where a model of the system to be tested is used, and faults are produced during its simulation [9,10]. These tools offer different levels of accuracy (bit accurate, cycle accurate) and observability depending on the processor model that is employed: ISA (Instruction Set Architecture) model, RTL (Register Transfer Level) model, etc.…”
Section: Introductionmentioning
confidence: 99%
“…With scaling down of the feature size of chips, field programmable gate arrays (FPGAs) and ASIC are more susceptible to the effects of ionizing irradiation, especially SEUs, which seriously threaten the reliability of circuits [1,2,3]. To reduce impacts of SEUs, triple modular redundancy (TMR), a highly efficient mitigation technique, is the most used method [4,5,6]. Metastability caused by CDC is an another problem which threaten the reliability of circuits.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, the specific modifications for synchronizers and their corresponding transmission protocols in TMR applications are required. At present, majority of researches focus on antiirradiation design [11,12,13,14,15,16,17], irradiation test [18,19,20,21,22], CDC design [7,23,24], metastable parameter test [25,26,27]. However, they have not addressed the problem combining both effects of SEUs and metastability.…”
Section: Introductionmentioning
confidence: 99%