2004
DOI: 10.1063/1.1835536
|View full text |Cite
|
Sign up to set email alerts
|

Resistive limitations to spatially inhomogeneous electronic losses in solar cells

Abstract: Spatial variations of the electronic properties of solar cells are simulated with the help of a multi-diode model. Increasing the local series resistance limits the degradation of the overall performance by reducing losses of the open circuit voltage originating from cell areas with minor electronic quality. At the same time, the fill factor of the device decreases such that an optimum local series resistance for maximum power conversion efficiency is found. The value of the optimum series resistance depends o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
48
0

Year Published

2009
2009
2021
2021

Publication Types

Select...
6
4

Relationship

0
10

Authors

Journals

citations
Cited by 83 publications
(49 citation statements)
references
References 10 publications
1
48
0
Order By: Relevance
“…In terms of device operation, this inhomogeneity can be visualized as (photo-) diodes with different V OC s connected in parallel, therefore reducing the cell's overall V OC . The effect on V OC stems from the different dark current that each diode will have 24,25 . The local absorber thickness may also affect the local J SC .…”
Section: Resultsmentioning
confidence: 99%
“…In terms of device operation, this inhomogeneity can be visualized as (photo-) diodes with different V OC s connected in parallel, therefore reducing the cell's overall V OC . The effect on V OC stems from the different dark current that each diode will have 24,25 . The local absorber thickness may also affect the local J SC .…”
Section: Resultsmentioning
confidence: 99%
“…According to the "weak diode" analysis, the V oc loss due to the weak diode is proportional to its size. Also, band-gap fluctuations have been known to affect the performance of CIGS devices [48,49].…”
Section: Secondary Phases Along the Grain Boundariesmentioning
confidence: 99%
“…Thin-film semiconductor devices often exhibit characteristics of a network of random diodes connected in parallel [102,[107][108][109] through a resistive electrode to cover those lateral fluctuations by corresponding variations of the local diode parameters. These fluctuations in electronic properties are a result of the material structure fluctuation [109,110] such as grain size, chemical composition, and film thickness between heterointerface and the heterojunction partners [111]. For a correct description of the electronic behavior of cells made from thin films, especially amorphous or polycrystalline absorber material with a large area, the simple equivalent circuit model is not sufficient to describe the bypass behavior of the spatially differentiated layers.…”
Section: Efficiencymentioning
confidence: 99%