We present a new analytical potential fluctuations model for the interpretation of current/voltage and capacitance/voltage measurements on spatially inhomogeneous Schottky contacts. A new evaluation schema of current and capacitance barriers permits a quantitative analysis of spatially distributed Schottky barriers. In addition, our analysis shows also that the ideality coefficient n of abrupt Schottky contacts reflects the deformation of the barrier distribution under applied bias; a general temperature dependence for the ideality n is predicted. Our model offers a solution for the so-called T0 problem. Not only our own measurements on PtSi/Si diodes, but also previously published ideality data for Schottky diodes on Si, GaAs, and InP agree with our theory.

Absolute measurements demonstrate internal quantum efficiencies in silicon solar cells to exceed unity for photon energies above the first direct band gap and to show distinct spectral features that correspond to specific points in the Brillouin zone. Ultraviolet radiation can generate hot carriers with sufficient energy to cause impact ionization which results in two electron hole pairs per incident photon.

The radiative recombination limit of photovoltaic power conversion under one sun terrestrial illumination is calculated for solar cells with lateral fluctuations of the band-gap energy. A simple analytical model quantifies the fluctuations by the standard deviation σEg from the mean band gap. The calculated maximum efficiency decreases by 1.7% (absolute) for σEg=50 meV and by 6.1% for σEg=100 meV with respect to a uniform band gap.

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