Ring Oscillator Structure For realistic Dynamic Stress Of MOSFETS And Interconnects

Winnerl, J.; Neppl, F.; Lill, A.; Roska, G.; Zatisch, W.

doi:10.1109/icmts.1988.672929

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Chains and Ring Oscillators1

Introduction1

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Cited by 5 publications

(2 citation statements)

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“…There is a great deal of litera-3. loading effects, ture on the design of delay chain circuits and the interpretation of data from them [111][112][113][114][115][116][117][118][119][120][121][122]. The interrupt oscillation during irradiation so that a designer and test engineer should review this ma-static bias condition can be obtained.…”

Section: Chains and Ring Oscillatorsmentioning

confidence: 99%

Radiation Effects Test Chip Guidelines

Alexander¹

1991

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Section: Chains and Ring Oscillatorsmentioning

confidence: 99%

Radiation Effects Test Chip Guidelines

Alexander¹

1991

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“…Motivated by Endo and Mori [19] and Winnerl et al [64] we consider in this paper a ring array of mutually coupled lossless transmission lines. For simplicity, we assume the transmission lines are resistively coupled and the capactive and inductive coupling among the system are neglected.…”

Section: Introductionmentioning

confidence: 99%

Self-Sustained Oscillations in a Ring Array of Coupled Lossless Transmission Lines

Xia

1996

Journal of Differential Equations

138

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In this paper, we derive a neutral difference-differential system with diffusion which arises from a ring array of coupled lossless transmission lines. We investigate the problem of self-sustained oscillations of the considered transmission lines and apply a global Hopf bifurcation theorem to establish the existence of multiple large amplitude phase-locked periodic solutions in the corresponding neutral system.

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Gate chain structures with on-chip clock generators for realistic high-speed dynamic stress

Shiono¹,

Mizusawa²

Proceedings of the 1991 International Conference on Microelectronic Test Structures

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Ring Oscillator Structure For realistic Dynamic Stress Of MOSFETS And Interconnects

Cited by 5 publications

References 0 publications

Radiation Effects Test Chip Guidelines

Radiation Effects Test Chip Guidelines

Self-Sustained Oscillations in a Ring Array of Coupled Lossless Transmission Lines

Gate chain structures with on-chip clock generators for realistic high-speed dynamic stress

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