2018
DOI: 10.1002/pssa.201800308
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Scanning Photoelectron Spectro‐Microscopy: A Modern Tool for the Study of Materials at the Nanoscale

Abstract: The advanced properties of modern materials originate from their nanoscale size and shape and from chemical modifications or doping. Special techniques that can measure the chemical state in the nanoscale are required for exploration and understanding the properties of these materials. While X‐ray photoelectron spectroscopy (XPS) can access the necessary chemical information, conventional setups have no spatial resolution. The scanning photoelectron microscope (SPEM) takes in advent the third generation synchr… Show more

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Cited by 15 publications
(14 citation statements)
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“…the whole image takes below 5 min, while the high-resolution Rh 3d or O 1 s spectra take less than 1 min. The overall energy resolution is 0.3 eV 50 . Due to the setup geometry, electrons emitted at an angle of 60° to the surface normal were registered.…”
Section: Methodsmentioning
confidence: 99%
“…the whole image takes below 5 min, while the high-resolution Rh 3d or O 1 s spectra take less than 1 min. The overall energy resolution is 0.3 eV 50 . Due to the setup geometry, electrons emitted at an angle of 60° to the surface normal were registered.…”
Section: Methodsmentioning
confidence: 99%
“…After NW dispersion onto a Si substrate, sample S2 was rapidly sealed into the UHV chamber of the ANTARES beamline at synchrotron SOLEIL . It should be noted that SPEM experiments could also be performed on vertical NW grown on their original substrate; , however, we dispersed the NWs on a substrate to measure individual NWs. Figure a shows the XPS spectrum of sample S2 acquired with large spot size.…”
Section: Resultsmentioning
confidence: 99%
“…The scanning photoelectron microscope (SPEM) allows spatially resolved XPS measurements in the submicron scale [ 32 , 33 ]. SPEM measurements were performed by using the Escamicroscopy beamline at Elettra synchrotron facility (Trieste, Italy).…”
Section: Methodsmentioning
confidence: 99%