Scanning polarization force microscopy investigation of contact angle and disjoining pressure of glycerol and sulfuric acid on highly oriented pyrolytic graphite and aluminum

Moldovan, A.; Bota, P. M.; Poteca, Teodor; Boerasu, I.; Bojin, Dionezie; Buzatu, Daniela; Enăchescu, Marius

doi:10.1051/epjap/2013130235

Cited by 11 publications

(14 citation statements)

References 15 publications

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“…Values of P 0 , δ, and П are reported in Table 1. As a comparison, these parameters obtained from similar measurements performed in our previous works [17,18] on mica, In the case of glycerol on native SiO 2 , the strength of the force appears to be two times lower than that for glycerol on bulk SiO 2 and almost five times smaller than that for glycerol on silicon. As we see, in the case of glycerol on mica, the strength of the force appears to be two times smaller than that for glycerol on stainless steel, HOPG, and aluminum and ten times smaller than the strength of the force in the case of glycerol on silicon.…”

supporting

confidence: 60%

Wetting properties of glycerol on silicon, native SiO₂, and bulk SiO₂by scanning polarization force microscopy

Moldovan

Bota

Dorobantu

et al. 2014

Journal of Adhesion Science and Technology

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Scanning polarization force microscopy, a relatively new non-contact scanning probe microscopy technique, was applied in order to investigate the properties of liquid surfaces (droplets), such as: topography, microscopic contact angle θ, surface potential energy P(e), spreading coefficient S, and disjoining pressure П. Investigations were carried out on glycerol droplets deposited on surfaces of bare silicon, silicon covered with native oxide, and bulk silicon oxide. Contact angle values were determined from directly measured topography profiles of micro-and nanodroplets. Values of surface potential energy, spreading coefficient, and disjoining pressure were calculated based on a model of the dependence of contact angle on droplet height. The results of these experiments offer valuable insights into the mechanisms of wetting phenomena at the microscopic scale.

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supporting

confidence: 60%

Wetting properties of glycerol on silicon, native SiO₂, and bulk SiO₂by scanning polarization force microscopy

Moldovan

Bota

Dorobantu

et al. 2014

Journal of Adhesion Science and Technology

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“…The substrates were held upside down at ~5 mm above the liquid until their surface achieved a "foggy" appearance, which indicated the presence of microscopic droplets. Optical microscopy (Figure 11a and c) confirmed the presence of small droplets [54]. Sulfuric acid droplets (50% vol.)…”

Section: Wetting Properties Of Glycerol and Sulfuric Acid On Highly Omentioning

confidence: 77%

“…This section presents results regarding the characterization of wetting properties at nanoscale, obtained in the Center for Surface Science and NanoTechnology (CSSNT) at the University "Politehnica" of Bucharest. The results were reported in references [54][55][56].…”

Section: Application Of Spfm Techniques For Nanometer Scale Wetting Imentioning

confidence: 98%

“…In this study, glycerol and sulfuric acid were chosen for the formation of liquid droplets on highly oriented pyrolytic graphite (HOPG); on aluminum-covered mica, the droplets were formed by glycerol [54].The HOPG substrates were freshly cleaved prior to the experiments. The aluminum film was deposited on freshly cleaved mica by thermal evaporation in vacuum.…”

Section: Wetting Properties Of Glycerol and Sulfuric Acid On Highly Omentioning

confidence: 99%

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Wetting Properties at Nanometer Scale

Moldovan¹,

Enăchescu²

2015

Wetting and Wettability

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The proposed chapter reviews a series of experimental techniques which enable the accurate quantitative study of wetting properties. The introductive part presents some of the many phenomena and processes influenced by wetting, underlining the importance of understanding the fundamental science involved. A few historical considerations about the quantitative study of wetting and related phenomena are given. Next, some of the "classical" techniques employed for studies at the macroscopic scale are presented. The importance of studies of such phenomena at microand nanometer level is underlined, as a consequence of the enormous influence that micro-and nanodevices play in our day to day activities, and examples of quantitative studies, involving various measurement techniques, are given from literature.A description of the basic phenomena related to polarization forces in Scanning Polarization Force Microscopy (SPFM) technique is given, followed by experimental details concerning the actual implementation of the technique. Examples of applications of SPFM are given from literature (from the spreading of liquid crystals on solid substrates to studies of corrosion at nanometer level). Particularly, it is emphasized how this versatile technique was successfully used for direct measurements of contact angles for liquid micro-and nano-droplets, enabling the calculation of the dependence of surface potential energy between the surfaces, the spreading coefficient and the disjoining pressure for micro-and nano-droplets.

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“…Table 2 show the roughness indicators (RA and RMS) for all the parameters investigated. To test the quality of ours depositions we performed the friction mapping on surfaces by AFM [4]. As can be seen in figure 5 quite uniform values were found for both layers.…”

Section: Physicsmentioning

confidence: 95%

The study of p-Si/Al2O3/n-Si (100) sandwiches structures deposited by KrF excimer laser ablation.

Moïse¹,

Brîncoveanu²,

Katona³

et al. 2016

ARA 40th Congress Proceedings

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Abstract:Laser ablation is a versatile technique for deposition of metals, semiconductors as well as dielectrics. Our pulsed laser deposition (PLD) system is set up into an ultra-high vacuum (UHV) machine with working pressure of 1.5*10 -10 Torr. In this work we report the successfully deposition of sandwiches structures p-Si/Al2O3/n-Si (100) substrate. The obtained thin layers were characterized by atomic force microscopy (AFM), scanning electron microscopy (SEM) and composition was investigated by energy dispersive X-ray (EDX). Also micro Raman spectroscopy was involved for measurement of the stress in nSi (100) substrates as well as top deposited p-Si. Depositions were performed at three different values for: distance between target and substrate (3, 4, 5 [cm]), temperature of substrate (400, 500, 600 [°C]), laser pulse energy (400, 500, 580 [mJ]) and laser pulse repetition rate (20, 30, 40 [Hz]). We conclude that the optimally conditions for Al 2 O 3 layer are: 5 cm, 500°C, 580 mJ, 20 Hz and for top p-Si same values except the pulse repetition rate, which is 30 Hz.

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Scanning polarization force microscopy investigation of contact angle and disjoining pressure of glycerol and sulfuric acid on highly oriented pyrolytic graphite and aluminum

Cited by 11 publications

References 15 publications

Wetting properties of glycerol on silicon, native SiO₂, and bulk SiO₂by scanning polarization force microscopy

Wetting properties of glycerol on silicon, native SiO₂, and bulk SiO₂by scanning polarization force microscopy

Wetting Properties at Nanometer Scale

The study of p-Si/Al2O3/n-Si (100) sandwiches structures deposited by KrF excimer laser ablation.

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Scanning polarization force microscopy investigation of contact angle and disjoining pressure of glycerol and sulfuric acid on highly oriented pyrolytic graphite and aluminum

Cited by 11 publications

References 15 publications

Wetting properties of glycerol on silicon, native SiO2, and bulk SiO2by scanning polarization force microscopy

Wetting properties of glycerol on silicon, native SiO2, and bulk SiO2by scanning polarization force microscopy

Wetting Properties at Nanometer Scale

The study of p-Si/Al2O3/n-Si (100) sandwiches structures deposited by KrF excimer laser ablation.

Contact Info

Product

Resources

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Wetting properties of glycerol on silicon, native SiO₂, and bulk SiO₂by scanning polarization force microscopy

Wetting properties of glycerol on silicon, native SiO₂, and bulk SiO₂by scanning polarization force microscopy