2011
DOI: 10.1088/0022-3727/44/46/464008
|View full text |Cite
|
Sign up to set email alerts
|

Scanning probe microscopy in material science and biology

Abstract: A review of the activity of scanning probe microscopy at our Institute is presented, going from instrumentation to software development of scanning tunnelling microscopy, atomic force microscopy and scanning near-field optical microscopy (SNOM). Some of the most important experiments in material science and biology performed by our group through the years with these SPM techniques will be presented. Finally, infrared applications by coupling a SNOM with a free electron laser will also be presented.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
8
0

Year Published

2015
2015
2022
2022

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 10 publications
(8 citation statements)
references
References 94 publications
0
8
0
Order By: Relevance
“…The samples for the AFM characterization were prepared by the casting method, by manually dropping 5 µL of sample solution onto freshly cleaved mica and then air dried overnight, as previously described [33]. The AFM images were acquired using a home-designed microscope, described in detail elsewhere [65], operating in contact mode, in air, at room temperature and constant 30% relative humidity. The AFM tips chosen were made of silicon nitride (Veeco, New York, NY, USA) with tip of asymmetric pyramidal shape and nominal radius on 10 nm.…”
Section: Mass Spectrometrymentioning
confidence: 99%
“…The samples for the AFM characterization were prepared by the casting method, by manually dropping 5 µL of sample solution onto freshly cleaved mica and then air dried overnight, as previously described [33]. The AFM images were acquired using a home-designed microscope, described in detail elsewhere [65], operating in contact mode, in air, at room temperature and constant 30% relative humidity. The AFM tips chosen were made of silicon nitride (Veeco, New York, NY, USA) with tip of asymmetric pyramidal shape and nominal radius on 10 nm.…”
Section: Mass Spectrometrymentioning
confidence: 99%
“…The AFM measurements were performed using a home‐designed microscope, described in detail elsewhere, 24,25 operating under controlled environmental conditions (room temperature and constant 30% relative humidity). The instrument was operated in the weak repulsive regime of constant force with a probe force below 1 nN.…”
Section: Methodsmentioning
confidence: 99%
“…The FV maps were acquired with two different microscopes, using different setups: a homemade AFM, described in detail elsewhere [ 23 , 24 ], and a commercial AFM (FlexAFM, Nanosurf, Liestal, CH). The homemade AFM works in the “row by row” acquisition modality and, to perform a FV map, requires the collection of a topography image followed by the collection of the series of FCs.…”
Section: Methodsmentioning
confidence: 99%