2017
DOI: 10.1515/aot-2017-0032
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Scattering from reflective diffraction gratings: the challenges of measurement and simulation

Abstract: The accurate simulation of stray light is essential for the prediction of signal detection fidelity in an optical instrument with high contrast requirements. In a spectrometer, the scattering from reflective gratings is poorly understood and difficult to characterize, but contributes significantly to the overall system stray light and reduction in contrast. This paper describes the approaches that will be taken at OHB System AG to establish a sufficiently precise fitting of bidirectional scatter distribution f… Show more

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Cited by 4 publications
(2 citation statements)
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“…Because the grating pitch is very small, the quality of the electrical signal is affected by the manufacturing process and collimation of the light source. Some researchers had analyzed the effect of scattering on Moiré fringe formation [18][19][20] and proposed some optimized schemes [21,22]. However, because the effect of the light source on measurement is not the main reason and the collimation of the light source is very limited [23,24], the measurement accuracy of the grating still relies on the precision of the grating manufacturing process.…”
Section: Introductionmentioning
confidence: 99%
“…Because the grating pitch is very small, the quality of the electrical signal is affected by the manufacturing process and collimation of the light source. Some researchers had analyzed the effect of scattering on Moiré fringe formation [18][19][20] and proposed some optimized schemes [21,22]. However, because the effect of the light source on measurement is not the main reason and the collimation of the light source is very limited [23,24], the measurement accuracy of the grating still relies on the precision of the grating manufacturing process.…”
Section: Introductionmentioning
confidence: 99%
“…For an easy fit procedure this function is approximated by a Harvey-Shack function (see Figure 1-1) and fitted to the measured BRDF of the grating at the peak of the diffraction order at which the grating is designed to operate. (detailed discussion see [7] and [9]). The fitted Harvey-Shack function is then compared to the Harvey-Shack function resulting from the requirement for compliancy.…”
Section: Introductionmentioning
confidence: 99%