No abstract

The accurate simulation of stray light is essential for the prediction of signal detection fidelity in an optical instrument with high contrast requirements. In a spectrometer, the scattering from reflective gratings is poorly understood and difficult to characterize, but contributes significantly to the overall system stray light and reduction in contrast. This paper describes the approaches that will be taken at OHB System AG to establish a sufficiently precise fitting of bidirectional scatter distribution functions (BSDFs) to existing data obtained from measurements of scattering from gratings. The work is being undertaken in preparation for the analysis and fitting of a BSDF to the scattering from the grating for the FLEX low-resolution spectrometer that will be measured in the second half of 2017.

No abstract

The accurate simulation of stray light is essential for the verification of the contrast requirements in optical instruments. In a spectrometer, the scattering from reflective gratings is difficult to characterize while contributing significantly to the overall system stray light and reduction of the spectrometer contrast. In addition, the multiple diffraction orders create a ghost sensitive environment, which must be considered in the design of the instrument. In this article, we present an experimental setup for, and measurement results from, the characterization of the bidirectional scattering distribution function (BSDF) of a holographic grating for a spectrometer applied in a typical earth observation mission with demanding stray light requirements. We observed distinct stray light peaks out of the diffraction plane, which are called ‘satellites.’ The main challenges in the measurement of grating BSDFs arise from the near angle limit, the determination of the instrument signature and the selection of the appropriate sampling (2D or 3D). Following the grating characterization, the next step is to introduce these measured BSDFs into stray light simulation. We have done that by fitting appropriate functions to the measured BSDF and defining them in the optical analysis software ASAP as a user-defined BSDF. Ghost analysis is done at the spectrometer level as a sensitivity analysis of the tilts of the optical elements. Due to the ghosting of higher diffraction orders of the grating, a high sensitivity to the tilts of some of the optical elements can be seen.