2013
DOI: 10.1109/ted.2013.2272943
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Schottky Collector Bipolar Transistor Without Impurity Doped Emitter and Base: Design and Performance

Abstract: In this brief, we report an alternative approach of implementing a Schottky collector bipolar transistor without doping the ultrathin silicon-on-insulator film. Using different metal work function electrodes, the electrons and holes are induced in an intrinsic silicon film to create the n-emitter and the p-base regions, respectively. Using 2-D device simulation, the performance of the proposed device has been evaluated. Our results demonstrate that the charge plasma-based bipolar transistor with Schottky colle… Show more

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Cited by 52 publications
(23 citation statements)
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“…Since a charge plasma p-n junction has already been experimentally demonstrated [23] and the charge plasma based doping-less bipolar junction transistor [25,26] and the junction-less TFET have been reported [8], we believe that our results may provide the incentive for further exploration of the doping-less TFET.…”
Section: Introductionmentioning
confidence: 63%
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“…Since a charge plasma p-n junction has already been experimentally demonstrated [23] and the charge plasma based doping-less bipolar junction transistor [25,26] and the junction-less TFET have been reported [8], we believe that our results may provide the incentive for further exploration of the doping-less TFET.…”
Section: Introductionmentioning
confidence: 63%
“…In the doping-less TFET, the "p" source and "n" drain regions are formed using the charge plasma concept [23][24][25][26]. Under thermal equilibrium conditions, for creating the "n" drain region by inducing electrons with a concentration similar to the N + drain doping of the reference device in the intrinsic silicon body, hafnium (work function=3.9 eV) is employed as the drain metal electrode.…”
Section: Device Structure and Simulation Parametersmentioning
confidence: 99%
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“…Several models have been done to calculate the tunneling current in bipolar transistor based on silicon and graphene material by solving the Schrödinger equation [4][5][6][7]. In this paper, we study the tunneling current in np-n bipolar transistor based on AGNRs by solving the relativistic Dirac equation.…”
Section: Introductionmentioning
confidence: 99%
“…The "n + " source/drain regions and "p + " body contact are formed using the charge plasma concept by using metal electrodes of a specific work function [10,11]. The charge plasma concept is used to realize both low power devices [12][13][14][15][16][17][18][19][20][21][22][23][24][25] and a high power p-i-n diode [26]. We show in this work that LDMOS can also be implemented using the charge plasma principle and consequently reduce the number of thermal steps required during the fabrication.…”
Section: Introductionmentioning
confidence: 99%