“…They used to determine the surface composition resulting from etching with several solutions to determine by Auger electron spectroscopy. They [6] have compared the current-voltage (I-V), capacitancevoltage (C-V) of Au/n-GaP, and In/n-GaP Schottky diodes, and concluded that the diode characteristics depend on the surface contamination such as residual oxide and metal. Duman et al [8] have fabricated Ni/n-GaP Schottky diodes by DC magnetron deposition.…”