Secondary Electron Emission Yields of Carbon Coated Copper and Niobium Real Surfaces

Septier, A.; Belgaroui, M.

doi:10.1109/tei.1985.348896

Cited by 13 publications

(11 citation statements)

References 4 publications

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“…Hence, we can either conclude that the sample that Bronshtein and Fraiman (1969) used was also oxidized, or that oxidation has little effect on d for Nb. Septier and Belgarovi (1985) have also measured d for Nb and their results are generally higher than ours or those of Bronshtein and Fraiman (1969). The calculations of Ding et al (2001) using Equation (4) are much higher than the experimental values from the cleaned specimen.…”

Section: Niobiumcontrasting

confidence: 59%

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison

et al. 2008

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The secondary electron (SE) yield, delta, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of delta but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment.

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Section: Niobiumcontrasting

confidence: 59%

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison

et al. 2008

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“…Case of D1 sample (no solder mask included) Fig. 8 shows the experimental yield of secondary electrons (SE) for copper in terms of the primary electron energy from various literature sources [16][17][18]. In our case, the primary electron energy is 1.5 keV, hence it can be seen that the SE yield (d) for Cu is around 0.7.…”

Section: Finite Element Modelingmentioning

confidence: 80%

Feasibility study of the application of voltage contrast to printed circuit board

Tan¹,

Gan²,

Chai³

2006

Microelectronics Reliability

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“…25. Black lines correspond to various experimental measurements (13,(34)(35)(36)(37)(38)(39) different characters of ELF. The influence of the different approaches to the q-space extrapolation (SPA vs. DFT), also has a different effect on the inelastic mean free path (IMFP) for the two materials.…”

Section: A Simulation Of Sey Of Copper and Aluminiummentioning

confidence: 99%

MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions

Polak

Морган

2021

Computational Materials Science

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is an open-source Monte Carlo code capable of calculating secondary electron emission ~~mg mput data ge~erate~ entirely from first principle (density functional theory) calculations. It utilizes the complex dielectric function and Penn's theory for inelastic scattering processes and relativistic Schrodinger theory by means of a partial-wave expansion method to govern elastic 'scattering. It allows the user to include explicitly calculated momentum dependence of the dielectric func~ion, as well as to utilize first-principle density of states in secondary electron generation, which provides a more complete description of the underlying physics. In this paper we thoroughly describe the theoretical aspects of the modeling, as used in the code, and present sample results obtained for copper and aluminum.

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Secondary Electron Emission Yields of Carbon Coated Copper and Niobium Real Surfaces

Cited by 13 publications

References 4 publications

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison

Feasibility study of the application of voltage contrast to printed circuit board

MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions

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