Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

Stapel, D.; Brox, O.; Benninghoven, A.

doi:10.1016/s0169-4332(98)00584-4

Cited by 58 publications

(48 citation statements)

References 15 publications

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“…71,76 Polyatomic yield enhancements are not as great for monolayers absorbed on metal or oxide surfaces, although the enhancement does increase with layer thickness. 75 C projectile ions, although a slight enhancement in yield for C 60 C is observed. However, increased damage by the polyatomic projectiles eliminates the AuM , Au 2 M H , and Au 2 M 2 H peaks observed for Cs C : without these peaks, no molecular information is observed in the spectra.…”

Section: Static Secondary Ion Mass Spectrometry (Sims)mentioning

confidence: 89%

Surface mass spectrometry of molecular species

et al. 1999

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Section: Static Secondary Ion Mass Spectrometry (Sims)mentioning

confidence: 89%

Surface mass spectrometry of molecular species

et al. 1999

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“…Table 1 and 2 summarize the relative intensities of the positive and negative signals. All spectra are dominated by RTIL related peaks, whereas the most intensive positive ion peak is that of the intact 1-butyl-3-methylimidazolium [bmim] + cation, and the most intensive negative ion peak is usually that of the intact bis(trifluoromethylsulfonyl)imide [NTf 2 ] − anion (except for Bi 2 + and Bi 3 + , where H − is the most intensive peak; shown in Fig. 2b) and c)).…”

Section: Positive and Negative Spectramentioning

confidence: 99%

“…Polyatomic projectiles, such as SF 5 + , [1,2,3,4] C 60 + , [5,6,7] Au n + [8,9] and Bi n + , [10,11,12,13,14] greatly enhance the secondary ion yields of large fragments, thus leading to a clearer material identification. Especially, the bismuth liquid metal ion gun [15] (LMIG) is of great interest due to the capability of emitting doubly charged ion species, e.g.…”

Section: Introductionmentioning

confidence: 99%

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Investigation of 1‐butyl‐3‐methylimidazolium bis(trifluoromethylsulfonyl)imide under Bi_n^x+ cluster ion bombardment

Holzweber

Hutter

2010

Surface & Interface Analysis

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to study 1-butyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide under Bi-ion and Bi-cluster-ion (Bi 2 -7 + , Bi 3,5,7 ++ ) bombardment in positive and negative polarity. Peak pattern as well as practical experiences with the bismuth cluster LMIG is discussed. Mass spectra with the best mass resolution were obtained using Bi 3 ++ or Bi 5 ++ as primary ion source. The secondary ion yield of high molecular ion is enhanced up to two orders of magnitude upon changing from ion to cluster ion bombardment.

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“…For example, under impact of polyatomic primary ions, the increase in secondary ion yield for organic multilayers on silver substrates was more pronounced than that for monolayer coverage [15,16].…”

Section: Introductionmentioning

confidence: 99%

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

Moon

Wells

Gardella

2011

J. Am. Soc. Mass Spectrom.

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This study reports the characteristic fragmentation patterns from two polysiloxane polymers that form ordered overlayer on silver substrates. Results are compared for the bombardment of various monatomic and polyatomic projectiles of Cs + , C 60 + (10 keV), Bi 1 + , and Bi 3 + (25 keV) in the high mass range time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra.Results are reported from sub-monolayer (solution cast) coverages of poly(dimethylsiloxane)s with the number average molecular weights (M n ) of 2200 and 6140 Da, respectively, and Langmuir-Blodgett monolayers of poly(methylphenylsiloxane) with molecular weights (MW) from 600 and 1000 Da. For each film, Bi projectiles resulted in the emission of positive silver cluster ions from the substrate under the polymer overlayer and peaks corresponding to silver cluster ions with larger mass were observed by impact of polyatomic 25 keV Bi 3 + projectiles. In addition, depending on the change of energy of Bi 3 + , a different pattern of fragments was observed. With Cs + and C 60 + impact, however, the emission of silver cluster ions was not detected. In the case of C 60 + impact for PDMS-6140, peaks corresponding to silver-cationized intact oligomers were not observed. In this paper, these results are explained by the possible bombardment mechanism for each projectile, based on its mass, energy, and split trajectories of the component atoms under the polyatomic impact.

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Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

Cited by 58 publications

References 15 publications

Surface mass spectrometry of molecular species

Surface mass spectrometry of molecular species

Investigation of 1‐butyl‐3‐methylimidazolium bis(trifluoromethylsulfonyl)imide under Bi_n^x+ cluster ion bombardment

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

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Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

Cited by 58 publications

References 15 publications

Surface mass spectrometry of molecular species

Surface mass spectrometry of molecular species

Investigation of 1‐butyl‐3‐methylimidazolium bis(trifluoromethylsulfonyl)imide under Binx+ cluster ion bombardment

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

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Investigation of 1‐butyl‐3‐methylimidazolium bis(trifluoromethylsulfonyl)imide under Bi_n^x+ cluster ion bombardment