“…Mostly used for elemental analyses and depth profiling, it is particularly relevant for many different fields of research including cultural heritage studies. Reviews of its use for the study of ancient glasses or metal artefacts already exist in the literature [Spoto 2000, Darque-Ceretti and Aucouturier 2004, Dowsett and Adriaens 2004, Adriens and Dowsett 2006, Anderle et al 2006, McPhail 2006, but as only elemental information is obtained, these studies are limited to inorganic materials.Nevertheless, the introduction of time-of-flight (ToF) analysers for SIMS analyses at the beginning of the 1980s, as well as the recent development of liquid ion sources delivering cluster projectiles now permit the analysis of organic materials with high sensitivity and selectivity. Moreover, thanks to its excellent lateral resolution (in the order of micrometres), and its minimal sample preparation, ToF-SIMS has become the reference technique for chemical imaging by mass spectrometry.…”