2012
DOI: 10.1002/pssc.201100716
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Selective etching of InGaAs/InP substrates from II–VI multilayer heterostructures

Abstract: Typically, II–VI heterostructures and devices are grown on commercially available III–V substrates. Often these substrates have strong absorption at the emission energy of the epitaxial layer, a problem when transmission measurements are required, as well as for some device applications. By removing the epilayers from the substrate the layer properties can be examined unhindered by the presence of the substrate. In this paper we present a selective etching technique for the removal of InGaAs/InP substrates fro… Show more

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Cited by 3 publications
(4 citation statements)
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“…The II-VI sample is transferred by entirely removing both the InP substrate and the InGaAs buffer layer, following Moug et al [20]. Once the InGaAs is removed, the only remaining material still attached to the glass with the PEG is the II-VI epi-layer.…”
Section: Epitaxial Lift-off and Transfermentioning
confidence: 99%
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“…The II-VI sample is transferred by entirely removing both the InP substrate and the InGaAs buffer layer, following Moug et al [20]. Once the InGaAs is removed, the only remaining material still attached to the glass with the PEG is the II-VI epi-layer.…”
Section: Epitaxial Lift-off and Transfermentioning
confidence: 99%
“…Diamond is typically used as an intracavity heatspreader [15], or extracavity heat-sink [16]; the former requiring good optical contact as well as thermal contact between the diamond and the intracavity surface of the sample, which can be achieved via capillary bonding (e.g. [17][18][19] [20]; however, in that case the structures were adhered to glass using wax, and cracking or buckling of the II-VI material was observed. This was attributed to strain in the epitaxial structure, despite the support of the adhesive, preventing further transfer of the structures.…”
Section: Accepted Manuscriptmentioning
confidence: 99%
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“…The quantum wells emit at 540 nm in a resonant periodic gain configuration for potential alternative use as a laser gain medium [9]. The InP substrate was removed by a combination of mechanical polishing and wet etch process using a solution of HCl:H 3 PO 4 in a ratio of 3:1, followed by the removal of the InGaAs layer with a solution of H 3 PO 4 :H 2 O 2 :H 2 O, in a ratio of 1:1:6 for maximum etch selectivity with the II-VI material [10]. The epi-side is fixed onto a temporary glass substrate for this step, using a wax, for mechanical support during processing.…”
Section: Device Design and Fabricationmentioning
confidence: 99%