2014
DOI: 10.1063/1.4859615
|View full text |Cite
|
Sign up to set email alerts
|

Selective growth of N-polar InN through an in situ AlN mask on a sapphire substrate

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

1
10
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 15 publications
(11 citation statements)
references
References 41 publications
1
10
0
Order By: Relevance
“…In fact, the binary InN material has unique and excellent intrinsic properties with the narrowest band gap of all the III-nitride family, low effective mass and a large drift-velocity, making it an ideal candidate for infrared light emitters and high-speed electronic devices [2], [3], [4], [5], [6] . However, the growth of high-quality InN layers is hampered by the high lattice mismatch with usual substrates [2], [7], [8], [9], [10], [11] . In an effort to circumvent this limitation, the 1D geometry of nanowires is used [12] .…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…In fact, the binary InN material has unique and excellent intrinsic properties with the narrowest band gap of all the III-nitride family, low effective mass and a large drift-velocity, making it an ideal candidate for infrared light emitters and high-speed electronic devices [2], [3], [4], [5], [6] . However, the growth of high-quality InN layers is hampered by the high lattice mismatch with usual substrates [2], [7], [8], [9], [10], [11] . In an effort to circumvent this limitation, the 1D geometry of nanowires is used [12] .…”
Section: Introductionmentioning
confidence: 99%
“…The SAG was performed on SiN masked Ga-polar GaN/c-Al2O3 templates with circular openings of 200 nm. It resulted in perfectly hexagonal InN nanorods delimited with (1-100) m-planes, (11)(12)(13)(14)(15)(16)(17)(18)(19)(20) a-planes and the top (0001) c-plane. However, it was reported that the optical and electrical properties of 1D nitride structures may heavily depend on their shape [23] .…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…It has been applied to achieve the epitaxial lateral overgrowth (ELOG) of GaN-based laser diodes for reducing the threading dislocation density. Until now, there are only a few reports on the SAG of InN, in which Mo-mask-patterned (0001) sapphire [11], Mo-mask-patterned (111) Si [17], nanohole-patterned GaN templates [18], and ultra-thin AlN masks were used [19]. However, the AlN masks are not periodical, and the fabrication of the metal masks is relatively expensive and complex.…”
Section: Introductionmentioning
confidence: 99%
“…In recent times, the crystal quality of InN has been enormously improved with controlled growth techniques such as molecular beam epitaxy and metal organic chemical vapour deposition. [5][6][7][8][9][10] In the last decade, the band gap of InN has been revised to B0.75 eV and the accepted band gap is less than the previously predicted value of B2 eV. The revised band gap value of InN opened up new applications in the infrared (IR) region as emitters and detectors.…”
Section: Introductionmentioning
confidence: 99%