“…The distribution of the number of studies by characterization technique is detailed in Figure S2. In parallel, few studies characterized the devices with Fourier transform infrared spectroscopy (FTIR, n = 2) [55,64], X-ray diffraction (XRD, n = 2) [55,64], differential scanning calorimetry (DSC, n = 3) [55,64,65], and thermal gravimetric analysis (TGA, n = 2) [65,66] techniques. In comparison, FTIR, XRD, and DSC techniques were applied to nanostructured system characterization (Figure S1) in 11, 12, and 9 studies, respectively.…”