1977
DOI: 10.1021/ja00465a023
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Semiconductor electrodes. 13. Characterization and behavior of n-type zinc oxide, cadmium sulfide, and gallium phosphide electrodes in acetonitrile solutions

Abstract: The photoelectrochemical behavior of n-ZnO, -CdS, and -GaP single crystal semiconductor electrodes was investigated in acetonitrile which contained various electroactive compounds whose standard redox potential varied by over 3.2 V.The cyclic voltammograms of the n-type semiconductors in the dark and illuminated were compared to the Nernstian behavior at a Pt disk electrode. The photodissolution of the semiconductor electrodes did not occur until the electrode potential was well positive of the flat band poten… Show more

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Cited by 121 publications
(72 citation statements)
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“…Thus it may be predicted that a defective surface (i.e., polycrystalline SC) can be beneficial in the preventing of the anodic photodissolution of low bandgap semiconductors (the slow hole injection process) (15). Such a "shielding" effect was recently found experimentally: The long-term stability of a polycrystalline film of CdSe was found to be superior to that of a single crystal material although the initial photocurrent of the latter is higher (18).…”
Section: Resultsmentioning
confidence: 99%
“…Thus it may be predicted that a defective surface (i.e., polycrystalline SC) can be beneficial in the preventing of the anodic photodissolution of low bandgap semiconductors (the slow hole injection process) (15). Such a "shielding" effect was recently found experimentally: The long-term stability of a polycrystalline film of CdSe was found to be superior to that of a single crystal material although the initial photocurrent of the latter is higher (18).…”
Section: Resultsmentioning
confidence: 99%
“…For the case of TBBQ voltammetry, it is crucial to note that the formal potential E o lies below the CB edge (~0.7 V vs. Fc 0/+ ) for ZnO 26 (i.e., it lies in the band gap), as shown schematically in Figure 1c. The key result of our paper is thus shown in Figure 2a, which displays the CV for TBBQ at the 5 nm ZnO electrode as a function of back gate voltage (V BG relative to a grounded contact on the ZnO, Figure 1a).…”
mentioning
confidence: 99%
“…Kohl and Bard observed a separation of oxidation and reduction peaks ( E p ) of 3.7 V (!) for hydroquinone on n-GaP [38]. In this case the oxidation reaction peak center was at a potential close to the conduction band edge and the reduction peak center at a much more negative potential.…”
Section: CVmentioning
confidence: 86%
“…In this case the oxidation reaction peak center was at a potential close to the conduction band edge and the reduction peak center at a much more negative potential. If such were the case for hematite we would not expect to see the reduction peak due to decomposition of the solvent (Kohl and Bard [38] worked in acetonitrile to avoid this problem). Fig.…”
Section: CVmentioning
confidence: 99%